Method for measuring orientation deviation angle of oriented silicon steel through X-ray diffraction

An oriented silicon steel, off-angle technology, used in material analysis using radiation diffraction, measuring devices, material analysis using wave/particle radiation, etc. Low, simple sample preparation, easy to use effect

Active Publication Date: 2019-03-19
INNER MONGOLIA UNIV OF SCI & TECH
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  • Description
  • Claims
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Problems solved by technology

[0008] The first method can accurately obtain the 2θ angle, but it significantly increases the complexity of the testing process
The second method cannot accurately obtain the desired 2θ angle

Method used

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  • Method for measuring orientation deviation angle of oriented silicon steel through X-ray diffraction
  • Method for measuring orientation deviation angle of oriented silicon steel through X-ray diffraction
  • Method for measuring orientation deviation angle of oriented silicon steel through X-ray diffraction

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Experimental program
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Effect test

Embodiment

[0038] This embodiment provides a method for measuring the orientation deviation angle of grain-oriented silicon steel by X-ray diffraction, which includes the following steps:

[0039] S1, after placing the oriented silicon steel at the center of the sample stage, set the light pipe angle to θ 0 -α, detector at θ 0 +α-β to θ 0 Scan within the angle range of +α+β; set the light pipe angle to θ 0 -α+Δθ 1 , the detector at θ 0 +α+Δθ 1 -β to θ 0 +α+Δθ 1 Scan within the angle range of +β; and so on, at intervals of angle Δθ 1 Gradually increase the light pipe angle and scan; when a significant diffraction peak appears in the spectral line obtained by the detector, continue to 1 Gradually increase the light pipe angle to scan until the intensity of the diffraction peak shows a downward trend, that is, stop scanning and obtain the light pipe angle θ with the highest diffraction intensity m1 ;

[0040] S2, the light pipe angle θ with the highest diffraction intensity obtain...

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Abstract

The invention belongs to the technical field of crystal texture measurement, and particularly relates to a method for measuring orientation deviation angle of oriented silicon steel through X-ray diffraction, including the steps of firstly, fixing a light pipe to the negative divergence of a theoretical diffraction angle, and utilizing a probe to scan to explore with large step to acquire probablediffraction angle by the standard of generating the diffraction peak; further, reducing the scanning range, gradually reducing scanning step, and finally determining the diffraction angle and deviation angle by the standard of the maximum diffraction peak intensity. By the method, accurate diffraction angle and orientation deviation angle of oversized-grain oriented silicon steel can be obtainedsimultaneously. Besides, the method has the advantages of simple sampling, low requirements on equipment, convenience in use and accuracy reaching 0.01 degrees.

Description

technical field [0001] The invention belongs to the technical field of measuring crystal texture, in particular to a method for measuring the orientation deviation angle of oriented silicon steel through X-ray diffraction. Background technique [0002] Silicon steel can be generally divided into two types: non-oriented silicon steel and oriented silicon steel. Oriented silicon steel is mainly used to orient the magnetic field. In the case of similar composition, the magnetic induction of oriented silicon steel is almost only related to the degree of deviation of the Gauss grain orientation, that is, the closer the Gauss grain is to the ideal (110)<001> orientation, the The higher the magnetic field strength. Therefore, paying attention to and accurately measuring the degree of deviation between the crystal plane of the parallel surface and the (110) plane plays an important role in the quality control of grain-oriented silicon steel. The current methods for measuring...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/207
CPCG01N23/20
Inventor 李一鸣吴忠旺韩沛张慧敏王海燕金自力任慧平
Owner INNER MONGOLIA UNIV OF SCI & TECH
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