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A crystal resonator test system and calibration method

A crystal resonator and test system technology, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems of low reliability of measurement results, achieve the effect of reducing system measurement uncertainty, simple system structure, and conducive to popularization

Active Publication Date: 2021-03-19
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, the present application provides a crystal resonator test system and calibration method to solve the problem of low reliability of measurement results of existing test systems and methods

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  • A crystal resonator test system and calibration method
  • A crystal resonator test system and calibration method
  • A crystal resonator test system and calibration method

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Embodiment Construction

[0012] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0013] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0014] figure 1 It is a schematic structural diagram of a crystal resonator testing system provided in the embodiment of the present application. Including a frequency source 1, ...

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Abstract

The invention discloses a crystal resonator measuring system. The system includes a frequency source, a vector voltmeter, a test fixture and an attenuator. The frequency source and the vector voltmeter each includes two output interfaces. The output interfaces are used for connection with external standard instruments for parameter calibration and for connection with a test fixture to form a testcircuit. The frequency source is used for generating two channels of exciting signals of the same frequency and power and connected with the test fixture and the vector voltmeter respectively. The attenuator is used for attenuating a frequency source signal, the vector voltmeter is used for measuring the vector signals at the two ends of the test fixture, and the test fixture is connected with a crystal resonator to be measured. The invention further discloses a calibration method for the crystal resonator measuring system. The performance of the frequency source and vector voltmeter is testedthrough an external standard instrument, and after theoretical modification and system uncertainty analysis, the system measurement characteristic is obtained. The system is simple in structure, a port and a connection wire are added, the system complexity is not increased, and the system is conducive to popularization.

Description

technical field [0001] The present application relates to a quartz crystal test system, in particular to a crystal resonator test system and a calibration method. Background technique [0002] Crystal resonator parameter test system, also known as crystal network analyzer, is a measurement equipment for testing crystal resonator resonant frequency, quality factor, crystal capacitance, dynamic capacitance, dynamic inductance and other parameters, including frequency source, attenuator, Power divider, vector voltmeter (phase meter and voltmeter) and other functional units. According to the measurement method of IEC or national standard, the output signal of the frequency source is divided into two paths through the power divider. The meter needs to test the amplitude and phase of the two signals separately, and calculate the measurement results through theoretical formulas. Currently, such devices come in the form of integrated computer boards. [0003] This board-type crys...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R35/00
CPCG01R31/00G01R35/005
Inventor 焦玉民康焱朱珠
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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