A fault tracing method and system
A fault source, fault technology, applied in general control systems, control/regulation systems, testing/monitoring control systems, etc., can solve problems such as lack of research on fault propagation mechanisms
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0070] see figure 1 , this embodiment provides a fault tracing method, including the following steps:
[0071] S1: Set at least two observation points at different positions of the traction drive control system to be tested, and establish a first propagation model between the observation points of the traction drive control system to be tested under normal operating conditions;
[0072] S2: Analyze the spatio-temporal characteristics of each observation point when different types of faults occur according to the first propagation model, and establish a fault signal propagation model according to the spatio-temporal characteristics. The fault propagation model includes the evolution fault information and fault propagation time between each observation point;
[0073] S3: Extract the fault diagnosis features of the observation point according to the evolution fault information, fault propagation time, and historical fault data of the observation point, and establish a fault dict...
Embodiment 2
[0203] Corresponding to the above method embodiments, this embodiment provides a fault tracing system, including a memory, a processor, and a computer program stored in the memory and operable on the processor, when the processor executes the computer program Steps to implement the method described above.
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com