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Test system of optical modules

A test system and optical module technology, applied in the field of optical modules, can solve the problems of inability to support diversified test solutions, increase the complexity and cost of test machines, etc., and achieve the effect of simplifying equipment configuration and saving costs

Pending Publication Date: 2019-03-29
APAT OPTOELECTRONICS COMPONENTS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The optical module testing device in the prior art cannot support diversified testing schemes. If multi-channel testing is to be performed, multiple devices are required, which increases the complexity and corresponding cost of test machine construction.

Method used

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  • Test system of optical modules
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  • Test system of optical modules

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Embodiment Construction

[0044] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, not all the embodiments. The components of the embodiments of the present invention generally described and illustrated in the drawings herein may be arranged and designed in various different configurations.

[0045] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ...

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Abstract

The invention discloses a test system of optical modules. The test system of the optical modules includes an error code receiving and sending main-chip, at least two optical interfaces, at least two electrical interfaces, a test board, a test instrument and a single chip microcomputer. The optical interfaces are connected with the error code receiving and sending main-chip. The error code receiving and sending main-chip, the test board and the test instrument are all connected with the single chip microcomputer. According to the system, the multiple optical interfaces and the multiple electrical interfaces are arranged, the optical interfaces are used for plugging and connection of SFP / SFP+ optical emission modules, and the electrical interfaces are used for connecting a radio frequency cable, and then connecting the test board; and control instructions are provided to a local reference clock, the error code receiving and sending main-chip and the test instrument through the single chip microcomputer, a simultaneous test on optical emission performance or optical receiving performance of multiple optical modules / optical devices is realized, a diversified test solution is realized,equipment configurations of a test machine platform are effectively simplified, and costs are saved.

Description

Technical field [0001] The present invention relates to the technical field of optical modules, in particular to a test system for optical modules. Background technique [0002] An optical module is an electronic device used for photoelectric conversion. The transmitting end of the optical module converts the received electrical signal into an optical signal, which is transmitted to the receiving end of the optical module through an optical fiber, and the receiving end converts the optical signal into an electrical signal for output . [0003] The optical module test device of the prior art cannot support diversified test schemes. If a multi-channel test is to be performed, multiple devices are required, which increases the complexity and corresponding cost of the construction of the test machine. Summary of the invention [0004] The main purpose of the present invention is to provide a test system for optical modules, which aims to realize diversified test schemes, simplify the e...

Claims

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Application Information

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IPC IPC(8): H04B10/079
CPCH04B10/0795
Inventor 庄礼杰杨强刘鑫
Owner APAT OPTOELECTRONICS COMPONENTS