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Electrical measuring method for sample after vacuum chemical reaction

A technology of chemical reaction and measurement method, which is applied in the field of chemistry, can solve the problems of complicated sample seat connection, no permanent electrical connection, cumbersome operation process, etc., and achieve the effect of avoiding sudden deterioration of vacuum degree, simple structure, and simple operation steps

Pending Publication Date: 2019-04-05
JINHUA VOCATIONAL TECH COLLEGE
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0002] Many chemical reactions, such as some gas-phase catalytic reactions, need to be carried out in a vacuum environment, that is, the chemical reactions of the reactants and subsequent characteristic tests are located in a vacuum chamber, and some special reaction processes need to be carried out in an ultra-high vacuum environment. The reagent is directly dropped on the surface of the solid sample. The first defect of the prior art: in the prior art, it is usually necessary to transfer the solid sample to the outside of the vacuum environment or pass a protective gas into the vacuum chamber. The operation process is cumbersome and impurities will be introduced. In addition, In some experiments, there is no permanent electrical connection between the sample and the sample transfer rod and the vacuum cavity, and a simple fixing structure is required to implement the electrical test; defect 2 of the prior art: the connection mode of the sample seat in the prior art is relatively complicated , the electrical measurement method of the sample after a vacuum chemical reaction can solve the problem

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  • Electrical measuring method for sample after vacuum chemical reaction
  • Electrical measuring method for sample after vacuum chemical reaction
  • Electrical measuring method for sample after vacuum chemical reaction

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Embodiment Construction

[0032] Such as figure 1 It is a schematic diagram when the sample seat of the present invention is located in the reaction chamber, such as figure 2It is a schematic diagram when the sample seat of the present invention is located in the test chamber, including a reaction chamber (1), an observation window (2), a liquid container (3), a linear drive (4), a cooling rod (5), a sample (6), a sample seat ( 7), sample table (8), metal rod (9), gas inlet (10), vacuum pump I (11), bellows I (12), gate valve (13), bellows II (14), test chamber (15 ), sample holder (16), transmission rod (17), vacuum pump II (18) and test circuit, xyz is a three-dimensional space coordinate system, and the outside of test chamber (15) is connected with vacuum pump II (18) and test circuit, vacuum pump I ( 11) An absorption pump cooled by liquid nitrogen, the reaction chamber (1), bellows I (12), gate valve (13), bellows II (14) and test chamber (15) are connected in sequence, when the gate valve (13)...

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Abstract

The invention relates to the field of chemistry, and discloses an electrical measuring method for a sample after a vacuum chemical reaction. A vacuum reaction and testing device comprises a reaction cavity, an observation window, a liquid container, a linear driver, a cooling rod, the sample, a sample seat, a sample table, a metal rod, a gas inlet, a vacuum pump I, a corrugated pipe I, a gate valve, a corrugated pipe II, a test cavity, a sample holder, a conveying rod, a vacuum pump II and a test circuit. A liquid reagent can be directly dripped on the surface of the sample in vacuum to carryout the chemical reaction, so that the vacuum degree of the periphery of the sample is prevented from being suddenly reduced; gaseous reagent molecules are frozen, heated and molten in a vacuum environment, so that a gaseous reagent is directly dripped on the surface of the solid sample, and impurities are not introduced; according to transferring and fixing methods of the sample seat, sample transfer is simple and convenient; the sample can be immediately used for electrical measurement after being subjected to the chemical reaction; the electrical property of the sample can be measured in avacuum cavity; and the method is suitable for experiments in which the electrical property of the sample after the chemical reaction needs to be measured immediately.

Description

technical field [0001] The invention relates to the field of chemistry, in particular to an electrical measurement method for a sample after a vacuum chemical reaction, which is used for a thin film sample to undergo a chemical reaction in a vacuum. Background technique [0002] Many chemical reactions, such as some gas-phase catalytic reactions, need to be carried out in a vacuum environment, that is, the chemical reactions of the reactants and subsequent characteristic tests are located in a vacuum chamber, and some special reaction processes need to be carried out in an ultra-high vacuum environment. The reagent is directly dropped on the surface of the solid sample. The first defect of the prior art: in the prior art, it is usually necessary to transfer the solid sample to the outside of the vacuum environment or pass a protective gas into the vacuum chamber. The operation process is cumbersome and impurities will be introduced. In addition, In some experiments, there is...

Claims

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Application Information

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IPC IPC(8): G01N27/00B01J3/04
CPCB01J3/002B01J3/006B01J3/04G01N27/00
Inventor 张向平方晓华赵永建
Owner JINHUA VOCATIONAL TECH COLLEGE