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Nano optical field spin-orbit interaction measurement system and method

A technology for orbiting and measuring light, which is applied in the field of nano-optics and nano-photonics measurement, and can solve problems such as difficulties in near-field measurement and inability to measure and study

Active Publication Date: 2020-07-14
TSINGHUA UNIV
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Problems solved by technology

In the traditional technology, the scanning near-field optical microscope based on the probe heterodyne interferometry technology can realize the near-field measurement of phase-resolved superdiffraction optical resolution, but it is difficult to directly realize the near-field measurement of handedness resolution at the same time, so it cannot be directly Measurement of spin-orbit interaction in nanometer optical field in the near field

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  • Nano optical field spin-orbit interaction measurement system and method
  • Nano optical field spin-orbit interaction measurement system and method
  • Nano optical field spin-orbit interaction measurement system and method

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Embodiment Construction

[0114] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0115] See figure 1 , the present embodiment provides a handedness-resolved probe heterodyne interferometry device 200 comprising: a spectroscopic module 210, a difference frequency generation device 220, a measurement light polarization control device 230, a focusing scanning device 240, an aperture-type scanning near-field optical Microscope device 250 , reference light polarization compensation device 260 and coupling device 270 . The single beam of laser light in the spectroscopic module 210 is divided into the original measurement light and the original reference light through the spectroscop...

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Abstract

The invention discloses a spin-resolved probe heterodyne interference device, a nano-light field spin-orbit interaction measurement system and method. The probe heterodyne interference device comprises the following parts: a beam splitting module, through which the single beam laser is divided into an original measuring light and an original reference light; a difference frequency generating device, configured to perform frequency modulation on the original measuring light and the original reference light, and output a measuring light and a reference light with predetermined frequency difference; a measuring light polarization control device, disposed in the transmission direction of the measuring light; a focusing scanning device, arranged to output the illumination light in the output direction of the reference light of the measuring light polarization control device; an aperture type scanning near-field optical microscope device, wherein the illumination light excites samples to generate nano light fields, and the aperture type scanning near-field optical microscope device collects the nano-light fields in near-field detection and outputs sample information light; a reference light polarization compensation device, disposed in the transmission direction of reference light, wherein the reference light is incident on the reference light polarization compensation device to output polarization compensation light; and a coupling device, to which the sample information light and the polarization compensation light are transmitted to interfere to generate heterodyne interference light.

Description

technical field [0001] The invention relates to the measurement fields of nano-optics and nano-photonics, in particular to a spin-resolved probe heterodyne interference device, a method and a system for measuring spin-orbit interaction in a nano-optic field. Background technique [0002] When light propagates in the medium, there are two kinds of rotations around the optical axis at the same time. One is the spin rotation derived from the photon’s chirality / handedness (chirality and helicity) in time. This rotation based on the photon’s polarization Has spin angular momentum (spin angular momentum). The other is derived from the rotation of the spatial distribution of light intensity and phase, and this rotation based on the spatial distribution of light has orbital angular momentum (orbit angular momentum). When a photon or light propagates in a non-homogeneous optical medium or is refracted or reflected on an optical surface, the spin angular momentum and orbital angular ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/63
CPCG01N21/63
Inventor 孙琳白本锋张小萌王佳
Owner TSINGHUA UNIV
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