Three-dimensional modelling measurement method of microscopic multi-phase structure based on section profile sequence
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TAIYUAN UNIV OF TECH
- Publication Date
- 2019-04-09
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Abstract
Description
technical field
[0001] The invention relates to the technical fields of mechanical manufacturing and image measurement in mechanical engineering, in particular to the field of three-dimensional metallographic testing. Background technique
[0002] In the 3D simulation analysis of multiphase materials such as particle-reinforced composite materials, polycrystalline metals, and porous materials, as well as the 3D simulation analysis of molding and cutting processes, and the physical measurement of 3D dimensions, it is necessary to measure the 3D dimensions of particle phases, crystals, and pores. , and generate a three-dimensional model reflecting the multi-phase material entity, which lays the foundation for evaluating the preparation quality of materials or performing high-precision three-dimensional simulation analysis. At present, the two-dimensional scale measurement and analysis of ordinary metallographic testing of multi-phase materials such as particle-reinforced compo...