Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Epilepsy detection integrated circuit based on sparse limit learning machine algorithm

An extreme learning machine, integrated circuit technology, applied in computing, medical science, computer parts and other directions

Active Publication Date: 2019-04-16
XI AN JIAOTONG UNIV
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] After searching the existing literature, it is found that there is no report on the implementation of integrated circuits using lifting wavelet transform to process EEG signals, extract features, and then use sparse extreme learning machines for training and classification.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Epilepsy detection integrated circuit based on sparse limit learning machine algorithm
  • Epilepsy detection integrated circuit based on sparse limit learning machine algorithm
  • Epilepsy detection integrated circuit based on sparse limit learning machine algorithm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0069] The present invention provides an epilepsy detection integrated circuit based on the algorithm of sparse extreme learning machine, which first generates a four-dimensional signal through the wavelet transform circuit module of the known type of EEG signal, and then calculates the circuit and mean value through the standard deviation in the feature extraction circuit module The calculation circuit generates a set of eight-dimensional vectors for each signal extraction feature, and then inputs these feature vectors to the classifier circuit module for training, and finally the EEG signals of unknown categories pass through the wavelet transform circuit module and feature extraction module, and then input to the classification Classify circuit modules. The invention can classify the EEG signals of epileptic seizures and non-epileptic seizures, so as to achieve the purpose of epilepsy detection.

[0070] see figure 1 , the present invention is an epilepsy detection integra...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an epilepsy detection integrated circuit based on a sparse limit learning machine algorithm. Signals in electroencephalogram data are divided by a window containing 256 points,and the data type is a 16-bit fixed-point number comprising an 8-bit integer part and an 8-bit decimal part; four-dimensional signals are generated from the electroencephalogram data of the known type through a wavelet transform circuit module, then the generated signals are input into a feature extraction circuit module to obtain eight-dimensional feature vectors, and then the eight-dimensionalfeature vectors are input into a classifier circuit module for training, classified and output; brain electric signals of the unknown type sequentially pass through the wavelet transform circuit module and the feature extraction circuit module to obtain eight-dimensional feature vectors, and the eight-dimensional feature vectors are input into a classifier circuit module, classified and output. Lifting type wavelet transform is used for processing the electroencephalogram signals, features with different frequency bands in a signal time domain and in a frequency domain can be obtained, and results are superior to those of a traditional filter and Fourier transform.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, and in particular relates to an epilepsy detection integrated circuit based on a sparse extreme learning machine algorithm. Background technique [0002] Epilepsy is caused by abnormal discharge of brain neurons, so epileptic seizures can have a great impact on people's EEG signals. Due to its non-invasive and convenient features, EEG examination plays an important role in the diagnosis of epileptic seizures, and it also helps to classify the types of epileptic seizures. All cases of clinically suspected epilepsy are diagnosed by EEG examination. diagnostic. At present, epilepsy detection through EEG still mainly relies on doctors to manually analyze the patient's EEG signals. This method is not only time-consuming, but also has no unified basis for judgment. its accuracy. [0003] Due to the many shortcomings of manual analysis of signals, coupled with the continuous development o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A61B5/00A61B5/0476G06K9/62
CPCA61B5/4094A61B5/72A61B5/726A61B5/7267A61B5/316A61B5/369G06F18/24G06F18/214
Inventor 李尊朝白海龙冯立琛刘宙思
Owner XI AN JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products