Comprehensive accelerator pedal test bench

Abstract

The invention discloses a comprehensive pedal test bench comprising a test rack, an electric control device and a host computer. The test rack carries an actuator of a test device, a sensor, and a tested object. The electric control device serving as a data conversion and transmission mechanism between the test rack and the host computer includes a power management unit, an electric cylinder control unit, a signal acquisition and processing unit, a data storage unit, and a data input / output module and is used for providing power for an electric cylinder, an accelerator pedal, a displacement sensor and a pressure sensor, collecting, processing, storing, and outputting an accelerator pedal signal, a displacement sensor signal, and a pressure sensor signal, and controlling the action and speed of the electric cylinder according to a command issued by the host computer. The host computer being a computer or a numerical control platform is provided with host computer software being compiledby development software of LabView, VB, MATLAB and the like and is responsible for test mode switching, data analysis and the like.

Description

Technical field: [0001] The invention relates to comprehensive performance detection of automobile electronic accelerator pedals, in particular to a comprehensive test bench for accelerator pedals. Background technique: [0002] As an important part of modern automobiles, electronic accelerator pedal is very important for its performance testing. At present, the commonly used testing methods are based on different testing items, and different equipment will be tested separately, such as using a durability test bench to test the durability of the electronic accelerator pedal, and using an output voltage detector to detect synchronization and output voltage curves. At the same time, the automatic analysis function of the testing equipment is poor, and the test results are mostly based on the on-site judgment of the testers. [0003] Problems and shortcoming existing in prior art, and the reason of occurrence: [0004] 1) Existing testing equipment has a single function and r...

AI Technical Summary

Problems solved by technology

[0004] 1) Existing testing equipment has a single function and needs a variety of equipment to complete the testing, and the cost of equipment is high

[0005] 2) The detection equipment used has a low degree of integration, and it is impossible to perform multiple tests at the same time, and the test time period is long

[0006] 3) The automatic analysis and offline analysis capabilities of the testing equipment are poor, and functions such as data storage, uploading, and automatic analysis cannot be realized, requiring on-site judgment by the inspectors, which takes up a lot of tester time

Images