Defect extraction method based on feature mining and weighted Bayesian classifier
A technology of Bayesian classifier and extraction method, which is applied in the direction of instruments, image analysis, character and pattern recognition, etc., and can solve the problems of no further mining of physical meaning, influence on accuracy, and reduction of clustering rationality
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[0100] The specific embodiments of the present invention are described below with reference to the accompanying drawings, so that those skilled in the art can better understand the present invention. It should be noted that, in the following description, when the detailed description of known functions and designs may dilute the main content of the present invention, these descriptions will be omitted here.
[0101] figure 1 It is a flow chart of a specific implementation of the defect extraction method based on feature mining and weighted Bayesian classifier of the present invention.
[0102] In this embodiment, as figure 1 As shown, the defect extraction method based on feature mining and weighted Bayesian classifier of the present invention includes the following steps:
[0103] Step S1: The thermal image sequence is represented as a three-dimensional matrix
[0104] The thermal image sequence acquired by the infrared thermal imager is represented by a three-dimensional ...
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