The invention discloses a method and
system for realizing
chip testing, and relates to the technical field of
chip testing, and the method comprises the steps: assembling a
chip testing
daughter board, loading a plurality of chips to be tested in a chip loading area, configuring a
switch matrix, a decoder and an activation
control unit, and generating a chip mapping matrix; selecting a
single chip to carry out a high-temperature operation lifetime test, monitoring the
power consumption stability of the chip in real time, and calculating the
power consumption deviation of the chip; executing a logic function test, a
time sequence test and a multi-channel
voltage output test, evaluating output consistency, and generating chip function
test data; based on the chip
power consumption deviation and the chip function
test data, the entropy-based
risk assessment method is adopted to calculate the
failure probability of the chip to be tested, the
failure probability distribution is analyzed by constructing a
failure mechanism decision model, and the power consumption
stability test and the function test of the chip to be tested are optimized. According to the method, the chip mapping matrix is generated through three-dimensional matrix operation, so that the test configuration time is shortened, and the test configuration complexity is reduced.