Active layer thickness monitoring method
A technology of active layer and insulating layer, which is applied in the monitoring field of active layer thickness, can solve problems such as timing problems, abnormal TFT switches, unstable gate scanning signals, etc., and achieve the effect of avoiding abnormalities
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[0026] In order to further illustrate the technical means adopted by the present invention and its effects, the following describes in detail in conjunction with preferred embodiments of the present invention and accompanying drawings.
[0027] see figure 1 , the present invention provides a method for monitoring the thickness of an active layer, comprising the steps of:
[0028] Step S1, please refer to figure 2 , provide a carrier machine 10, on which a large plate 20 is formed; the large plate 20 includes a panel area 21 and a GOA area 22 surrounding the panel area 21; the GOA area 22 includes a plurality of films A transistor 221; the thin film transistor 221 includes an active layer 2211;
[0029] Step S2, please refer to image 3 , provide a monitoring machine 30, the monitoring machine 30 monitors the thickness of the active layer 2211 of the thin film transistor 221 in the GOA region 22, when the thickness of the active layer 2211 is less than a preset threshold, t...
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