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A method for detecting the cleanliness of a dishwasher

A cleanliness detection, dishwasher technology, applied in the washing machine/rinsing and washing machine parts, material resistance, material capacitance and other directions of tableware, can solve the problems of affecting the detection accuracy, easy to be polluted, high cost, etc., to achieve less pollution, The effect of saving working time and low cost

Active Publication Date: 2021-09-17
ZHEJIANG OUYI SMART KITCHEN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention mainly solves the technical problems of high cost, easy to be polluted and low precision existing in the scheme of detecting the cleanliness of dishwashers in the prior art, and provides a clean dishwashing machine with low cost and not easy to be polluted so as to affect the detection accuracy. degree detection method

Method used

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  • A method for detecting the cleanliness of a dishwasher
  • A method for detecting the cleanliness of a dishwasher

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Embodiment 1

[0031] Embodiment 1: a method for detecting the cleanliness of a dishwasher, comprising the following steps:

[0032] S01. When water flows through the water outlet of the dishwasher, the capacitance detection circuit 9 reads the detection signal of the first detection device 8 installed at the water outlet;

[0033] S02, the capacitance detection circuit 9 sends the read detection signal to the operational amplifier 11;

[0034] S03, the operational amplifier sends the detection signal to the single-chip microcomputer 12 after amplifying the detection signal;

[0035] S04, the single-chip microcomputer calculates the relative permittivity ε of the medium between the electrode A and the electrode B of the first detection device according to the detection signal r ;

[0036] S05, the single-chip microcomputer detects the resistance R between the electrode A and the electrode B of the first detection device according to the resistance detection circuit 10 and calculates the co...

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Abstract

The invention discloses a method for detecting the cleanliness of a dishwasher, which comprises the following steps: when a water flow passes through the water outlet of the dishwasher, a capacitance detection circuit reads the detection signal of a first detection device installed at the water outlet; Send the read detection signal to the operational amplifier; the operational amplifier amplifies the detection signal and sends it to the single-chip microcomputer; the single-chip computer calculates the relative permittivity ε of the medium between the electrode A and the electrode B of the first detection device according to the detection signal r The single-chip microcomputer detects the resistance R between the electrode A and the electrode B of the first detection device according to the resistance detection circuit and calculates the conductivity K of the medium between the electrode A and the electrode B; according to the relative permittivity ε r and conductivity to determine whether the water at the outlet of the dishwasher is clean water. The invention has low cost, is not easy to be polluted to affect the detection accuracy, and is suitable for all dishwashers.

Description

technical field [0001] The invention relates to the field of dishwashers, in particular to a method for detecting the cleanliness of dishwashers. Background technique [0002] A dishwasher is a device that automatically cleans tableware such as bowls, chopsticks, plates, plates, knives, and forks. During the cleaning process, accurately judging whether the tableware is rinsed clean can save water, electricity and time. The existing solution is generally to detect the turbidity of the flushing water through a liquid turbidity detector. The turbidity detector uses the scattered light reflected to the detector to detect the particles in the liquid, but this method is difficult to make light source and detector If there is no consistency, calibration is required, and if the lens is contaminated, the test results will also be affected. At the same time, different ambient temperatures will affect the emission and reception of the light source, thereby affecting the measurement ac...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/22G01N27/08A47L15/42
Inventor 胡正军陈曙光方志明
Owner ZHEJIANG OUYI SMART KITCHEN CO LTD
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