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Alternating current testing device and method for Seebeck coefficient

A technology for testing devices and coefficients, applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of high temperature control requirements, slow measurement speed, poor effect, etc., and achieve the goal of avoiding DC noise The effects of interference, fast response speed, and flexible relative position relationship

Inactive Publication Date: 2019-05-21
MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Aiming at the defects of high requirement for temperature control, slow measurement speed, and poor effect of suppressing DC noise in the prior art, an object of the present invention is to provide a kind of AC testing device for Seebeck coefficient. Input and output signals to avoid the impact of DC noise on the test results. Second, the test accuracy is improved through the lock-in amplifier. Third, the structure of the sample stage and chuck is adapted to various shapes and different sizes of samples. The structure of the AC test device Simple, convenient operation, fast measurement speed

Method used

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  • Alternating current testing device and method for Seebeck coefficient
  • Alternating current testing device and method for Seebeck coefficient
  • Alternating current testing device and method for Seebeck coefficient

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] An AC testing device for Seebeck coefficient, including a sample chamber and a sample table 1, a chuck 2, a main heater 3, a sub heater 4, a main probe 5, a sub probe 6, a main temperature measuring element 7, and a sub temperature measuring Component 8, temperature controller 9, lock-in amplifier 10, AC power meter 11.

[0047] The sample chamber is a space that can be sealed. The sample table 1, the chuck 2, the main heater 3, the auxiliary heater 4, the main probe 5, the auxiliary probe 6, the main temperature measuring element 7, and the auxiliary temperature measuring element 8 are located in the sample chamber, and the temperature controller 9, The lock-in amplifier 10 and the AC power meter 11 are located outside the sample room and connected to a computer 002 respectively.

[0048] The main heater 3, the main probe 5, and the main temperature measuring element 7 are all installed on the sample stage 1, and the main probe 5 can directly contact with the sample 0...

Embodiment 2

[0065] In this embodiment, on the basis of Embodiment 1, the main temperature measuring element 7 and the auxiliary temperature measuring element 8 in the AC testing device are further limited.

[0066] Both the main temperature measuring element 7 and the auxiliary temperature measuring element 8 are resistance thermometers. Alternatively, both the main temperature measuring element 7 and the auxiliary temperature measuring element 8 are thermocouples. Resistance thermometers and thermocouples are mature existing products. The improvement of this embodiment does not lie in the improvement of resistance thermometers or thermocouple structures. Only resistance thermometers or thermocouples are used for temperature measurement, and resistance thermometers or thermocouples are used for temperature measurement. Prior art, so its structure or working principle will not be described in detail.

[0067] Other parts of this embodiment are the same as those of Embodiment 1, so details...

Embodiment 3

[0069] In this embodiment, on the basis of Embodiment 1 or Embodiment 2, the working environment of the sample chamber is further limited.

[0070] The working environment of the sample chamber is a vacuum environment, that is, the main probe 5, the auxiliary probe 6, and the sample 001 are all in a vacuum environment during the test. Alternatively, the working environment of the sample chamber is a protective gas environment, that is, the main probe 5 , the auxiliary probe 6 , and the sample 001 are all in a protective gas environment during the test.

[0071] When the AC measuring device measures the Seebeck coefficient of the sample 001, the main heater 3 heats the sample stage 1 to provide the required ambient temperature; in order to prevent the sample 001 from being oxidized, the sample chamber can be evacuated or filled with protective gas. The shielding gas in the present invention can be a commonly used shielding gas, such as nitrogen, argon or a mixture thereof.

[...

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Abstract

The invention provides an alternating current testing device for a Seebeck coefficient. The alternating current testing device comprises a sample table, a chuck, a main heater, an auxiliary heater, amain probe, an auxiliary probe, a main temperature measuring element and an auxiliary temperature measuring element. The main heater, the main probe and the main temperature measuring element are mounted on the sample table; the auxiliary heater, the auxiliary probe and the auxiliary temperature measuring element are installed on the chuck, a temperature controller connected with the main heater and the main temperature measuring element, a lock-in amplifier connected with the auxiliary temperature measuring element, an alternating current power meter connected with the auxiliary heater are connected with a computer separately, and the sample table and the chuck clamp a sample to measure the Seebeck coefficient. The structure is simple. The invention further discloses an alternating current testing method of the Seebeck coefficient. the amplitude delta V of alternating current voltage and the amplitude delta T of temperature oscillation are measured in an input and output alternating current signal mode, the Seebeck coefficient is obtained through calculation according to the ratio of the amplitude delta V of the alternating current voltage and the amplitude delta T of the temperature oscillation, the temperature control requirement is low, the testing speed is high, and direct current signal interference is avoided.

Description

technical field [0001] The invention relates to the technical field of testing devices, in particular to an AC testing device and method for Seebeck coefficients. Background technique [0002] In recent years, thermoelectric materials, as new energy materials, have attracted widespread attention because they can realize the mutual conversion between thermal energy and electrical energy. Thermoelectric materials have a series of advantages such as no noise during operation, no need for transmission parts, clean and environmentally friendly, and long service life, which makes this material have very important application prospects. [0003] Seebeck coefficient (Seebeck coefficient), also known as thermoelectric coefficient, is one of the important performance parameters for evaluating thermoelectric materials. By definition, the Seebeck coefficient of a material can be expressed as [0004] [0005] Among them, S is the Seebeck coefficient of the material, ΔT is the tempe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20G01R27/08
Inventor 刘毅潘启发刘静杨瑞龙朱康伟
Owner MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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