A microwave material electromagnetic parameter measuring instrument and measuring method

Abstract

The invention discloses a microwave material electromagnetic parameter measuring instrument and a measuring method thereof. The measuring instrument comprises the components of a laser heating device,a temperature detecting and control device, an environment control device, a microstrip line testing device, a vector network analyzer and a control system. According to the microwave material electromagnetic parameter measuring instrument, through adding the laser heating system, the temperature detecting and control device and the environment control device based on a traditional microstrip line testing device, an electromagnetic parameter of a to-be-measured microwave material at a testing temperature in a testing frequency range is acquired. The measuring instrument can control an appropriate laser power, thereby realizing gradient temperature increase and realizing a warm keeping effect. When the temperature reaches a preset temperature, a warming keeping program can be started so that the current testing condition is stabilized in a required temperature condition. A warm keeping manner and a gradient heating manner are used for preventing sudden crack of the to-be-measured microwave material because of non-uniform heating caused by high heating speed.

Description

technical field [0001] The invention relates to the field of microwave testing, in particular to a microwave material electromagnetic parameter measuring instrument and a measuring method. Background technique [0002] With the rapid development of communication technology, microwave materials have been widely used in many fields such as radar navigation, aerospace, microwave communication, national defense and military industry, electronic technology and new materials. However, in the process of using the flat dielectric material, the temperature of the flat dielectric material often rises, and the frequency band of the surrounding environment changes. The increase in temperature and the change in the environmental frequency band will bring about changes in the electromagnetic parameters of the flat dielectric material. If the electromagnetic parameters of the material at high temperature cannot be accurately tested, there will be a great misjudgment of the electromagnetic ...

AI Technical Summary

Problems solved by technology

However, when testing the electromagnetic parameters of the sample to be tested under high temperature conditions, the sample needs to be heated to a higher temperature, and the traditional method of testing will cause inaccurate measurement results and even damage the measurement fixture

Therefore, the traditional microstrip line method is no longer suitable for the measurement of electromagnetic parameters of microwave materials at high temperatures

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