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Transistor and preparation method thereof, display substrate and display device

A technology of transistors and substrates, applied in the direction of transistors, semiconductor/solid-state device manufacturing, electric solid-state devices, etc., can solve the problem of shortening the effective channel length, aggravating the influence of short-channel effect threshold voltage uniformity of transistors, and uniformity of transistor threshold voltage To improve the uniformity of the threshold voltage, improve the display quality, and improve the display quality

Pending Publication Date: 2019-06-07
HEFEI XINSHENG OPTOELECTRONICS TECH CO LTD +1
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Problems solved by technology

[0003] However, the short-channel effect of the top-gate oxide semiconductor transistor will affect the uniformity of the threshold voltage of the transistor to a certain extent.
Especially in the conductorization process of the active layer of the transistor, the oxide semiconductor material in the active layer will diffuse into the channel, so that the effective channel length of the transistor is further shortened, which further aggravates the short channel effect of the transistor on its threshold value. Effect of Voltage Uniformity

Method used

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  • Transistor and preparation method thereof, display substrate and display device
  • Transistor and preparation method thereof, display substrate and display device
  • Transistor and preparation method thereof, display substrate and display device

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Embodiment Construction

[0046] In order for those skilled in the art to better understand the technical solution of the present invention, a transistor and its manufacturing method, a display substrate and a display device provided by the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0047] Since the channel of the top-gate oxide semiconductor transistor is shorter, the uniformity of its threshold voltage is affected by its short-channel effect. Especially in the conductorization process of the active layer of transistor oxide semiconductor material (eg: IGZO), the conductorized regions on the opposite sides of the active layer will have a certain impact on the middle non-conductorized region (effective channel region), Such as in the process of conductorization, such as figure 1 As shown, the oxide semiconductor material in the conductive region 8 on opposite sides of the active layer 5 will diffuse to the middle...

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Abstract

The invention provides a transistor, a preparation method thereof, a display substrate and a display device. The transistor comprises a substrate structure, a gate electrode, a source electrode, a drain electrode and an active layer, wherein the gate electrode, the source electrode, the drain electrode and the active layer are arranged on the substrate structure. The gate electrode, the source electrode and the drain electrode are all located at one side, deviating from the substrate structure, of the active layer. The active layer comprises a first region corresponding to an orthographic projection region of the gate electrode on the substrate structure and a second region located outside the orthographic projection region, wherein the second region is made of a conductive semiconductor material, and the surface, in contact with the first region, of the substrate structure and the surface, in contact with the second region, of the substrate structure are not in the same plane. The surface, in contact with the first region, of the substrate structure and the surface, in contact with the second region, of the substrate structure are not in the same plane, so the transistor enables the height difference to be formed between the first region and the second region of the active layer, and the diffusion path of an active layer material from the second region to the first region in the conductor formation is lengthened, and the diffusion of the active layer material needs greater energy, thereby improving the poor threshold voltage uniformity of the transistor caused by the short-channel effect.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to a transistor and its preparation method, a display substrate and a display device. Background technique [0002] At present, AMOLED products are developing towards high definition, large size and high refresh rate. This puts higher requirements on the thin film transistor (TFT) of the AMOLED driving circuit. Since the top gate (Top Gate) oxide semiconductor transistor can effectively reduce the parasitic capacitance, the refresh frequency is better; and its channel is shorter, the size is smaller, and it can better meet the needs of AMOLED development, so the top gate oxide semiconductor transistor It is a key direction of future research and development. [0003] However, the short-channel effect of the top-gate oxide semiconductor transistor will affect the uniformity of the threshold voltage of the transistor to a certain extent. Especially in the conductorization ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/786H01L21/34
CPCH01L29/78696H01L29/7869H01L29/78603H01L27/1225H10K59/1213
Inventor 宋威赵策丁远奎王明刘军胡迎宾李伟倪柳松
Owner HEFEI XINSHENG OPTOELECTRONICS TECH CO LTD
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