Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An image classification and recognition method for depth feature estimation based on subspace decomposition

A subspace decomposition and depth feature technology, applied in the field of image classification and recognition, can solve the problems of occluded images that do not show good results, consume a lot of time for models, and are not suitable for applications, etc., to achieve faster classification, convenient use, and high flexibility Effect

Active Publication Date: 2019-06-18
TONGJI UNIV
View PDF9 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

First, these works only improved the results for face recognition, but did not show good results for occluded images in general.
Second, these jobs are not suitable for future cloud-based applications because they attempt to restore
Third, these works usually require a large number of partially occluded or missing images and time-consuming training of generative models
Finally, these efforts require retraining or fine-tuning the generative model for new occlusion patterns, which is often complex and time-consuming

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An image classification and recognition method for depth feature estimation based on subspace decomposition
  • An image classification and recognition method for depth feature estimation based on subspace decomposition
  • An image classification and recognition method for depth feature estimation based on subspace decomposition

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. This embodiment is carried out on the premise of the technical solution of the present invention, and detailed implementation and specific operation process are given, but the protection scope of the present invention is not limited to the following embodiments.

[0046] We observe that in the deep feature space, ε i is a structured error clustering outside the linearly spanned class subspace of deep feature vectors of unoccluded images. This shows that ε i lies in a low-dimensional subspace, called the occlusion error subspace, which is almost independent of the category subspace. Inspired by this observation, we propose a Subspace Decomposition Based Estimation method (SDBE) to extract the depth features of unoccluded images by constrained projection of the depth features of occluded images in the category subspace along the occlusion error...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an image classification and recognition method for depth feature estimation based on subspace decomposition. The method comprises the steps of S1, obtaining an unshielded image and an additional image pair of a training set; S2, extracting a depth feature vector from each input image; S3, calculating the difference between the depth feature vectors of the occluded image and the depth feature vectors of the unoccluded image in the additional image pair to obtain an error vector; S4, forming a first subspace by using the calculated depth feature vectors of all the unshielded images, forming a second subspace by using the error vectors, and forming a cascade dictionary based on the first subspace and the second subspace; S5, calculating a coefficient matrix based on the cascade dictionary; S6, training a classifier based on all column vectors of the first subspace; And S7, performing classification and identification on the to-be-identified image based on the cascade dictionary, the coefficient matrix and the classifier. Compared with the prior art, the method has the advantages of wide application range and the like.

Description

technical field [0001] The invention relates to an image classification and recognition method, in particular to an image classification and recognition method based on subspace decomposition for depth feature estimation. Background technique [0002] Occlusion happens from time to time in real life. Classifying occluded images is not difficult for the human visual system. However, in the field of computer vision, it remains an extremely challenging task even for deep convolutional neural networks that have recently achieved great success in many computer vision tasks. State-of-the-art convolutional neural networks have tens of millions of parameters, so even classification of unoccluded images usually requires a large data set to support good results. However, in practical applications, it is undoubtedly very difficult to collect a large amount of occlusion image data. A popular option is to train the network directly on datasets of unoccluded images or datasets containi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/62
Inventor 岑峰赵啸宇
Owner TONGJI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products