Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Industrial process fault diagnosis method based on Bayesian information criterion

An industrial process and fault diagnosis technology, applied in the direction of electrical testing/monitoring, etc., can solve the problem of poor generality of fault isolation technology, and achieve the effects of high detection speed and accuracy, improved computing efficiency, and strong versatility

Inactive Publication Date: 2019-06-28
HUAZHONG UNIV OF SCI & TECH
View PDF11 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides an industrial process fault diagnosis method based on Bayesian information criterion to solve the technical problem of poor versatility in the existing fault isolation technology

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Industrial process fault diagnosis method based on Bayesian information criterion
  • Industrial process fault diagnosis method based on Bayesian information criterion
  • Industrial process fault diagnosis method based on Bayesian information criterion

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] An industrial process fault diagnosis method 100 based on Bayesian information criterion, such as figure 1 shown, including:

[0042] Step 110, obtaining the normal sample data set and the untested sample data set of the industrial process, based on the normal sample data set, determining the control limits of various monitoring statistics and the fault sample data set in the untested sample data set;

[0043] Step 120, based on PCA decomposition, construct a unified expression of various monitoring statistics of each fault sample data, and reconstruct the fault sample data to form a first objective function, the first objective function is the value of the unified expression minimum;

[0044] Step 130, transform the first objective function into a mixed integer nonlinear programming function in the form of Bayesian information criterion, and solve the mixed integer nonlinear programming function according to the forward selection algorithm and the branch and bound alg...

Embodiment 2

[0110] A storage medium, in which instructions are stored, and when a computer reads the instructions, the computer is made to execute any one of the above-mentioned methods for diagnosing industrial process faults based on Bayesian information criterion.

[0111] The relevant technical solutions are the same as those in Embodiment 1, and will not be repeated here.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an industrial process fault diagnosis method based on the Bayesian information criterion. The method comprises: collecting normal industrial data and calculating several kindsof detection statistics amounts based on normal data; carrying out fault detection on a to-be-detected sample; expressing a fault isolating task into a combinatorial optimization problem; convertingthe problem into a mixed integer nonlinear programming problem by combining the Bayesian information criterion; on the basis of a forward selection algorithm, simplifying the problem into a mixed integer quadratic programming problem; on the basis of a branch-and-bound algorithm, solving a series of similar mixed integer quadratic programming problem to obtain a fault variable combination causingthe sample fault. The industrial process fault diagnosis method has high universality; and the fault variable can be identified without predetermining a fault direction or a known historical fault data set. When the amplitude of the fault is small, an accurate diagnosis result is obtained. Besides, the combination optimization problem is transformed into the quadratic programming problem with sparse constraints for calculation, so that the computational efficiency is improved substantially.

Description

technical field [0001] The invention relates to the technical field of industrial process fault diagnosis, in particular to an industrial process fault diagnosis method based on Bayesian information criterion. Background technique [0002] Efficient and reliable industrial process monitoring plays an extremely important role in ensuring factory safety, product quality and energy efficiency. Rapid advances in measurement, automation, and computer technology have facilitated the use of data-driven techniques. The two processes of fault detection and fault isolation make up fault diagnosis. Since process variables are often highly correlated, multivariate statistical methods are often used for fault detection. Among them, the PCA method has attracted considerable attention. Although the use of principal component analysis for fault detection is relatively mature, its application in fault isolation still needs extensive research. [0003] Contribution maps are the most commo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G05B23/02
Inventor 郑英刘浪张洪万一鸣樊慧津
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products