Testing method for modulation transfer function of linear array infrared detector of shape of Chinese character "pin"

Abstract

The invention relates to a testing method for the MTF (Modulation Transfer Function) of a linear array infrared detector of the shape of a Chinese character "pin". The method comprises the following steps that: using a black body to carry out irradiation on a V-shaped target to obtain infrared imaging; moving a linear array infrared detector, which is packaged in Dewars, of the shape of a Chinesecharacter "pin" to finish focusing and the quick positioning of a target blade edge image and two rows of pixels of linear array infrared detector of the shape of the Chinese character "pin"; carryingout permutation and combination on the output data of two rows of pixels to obtain an ESF (Edge Spread Function); utilizing an algorithm to remove an effective response output pixel to enable the calculation of an inclination angle to be more accurate so as to effectively improve the testing accuracy of the linear array device MTF; and finally, calculating the MTF of the linear array device of the shape of the Chinese character "pin", and taking a MTF numerical value on the Nyquist frequency of the device as a final representation value of the device. By use of the testing method, the lineararray device of the shape of the Chinese character "pin" and the image blade edge of the V-shaped target can be accurately positioned, testing speed is quick, and the ineffective response pixel of thelinear array is rejected to improve testing accuracy. The method is suitable for testing the MTF of straight line shaped array infrared detectors, area array infrared detectors and nonstandard lineararray infrared detectors of the shape of the Chinese character "pin".

Description

[0001] Technical field: [0002] The invention relates to a method for testing the modulation transfer function of an infrared detector, in particular to a method for testing the modulation transfer function of a character-shaped line array infrared detector, and belongs to the technical field of infrared photoelectric testing. [0003] Background technique: [0004] The modulation transfer function (MTF) is an important connection parameter connecting the preparation of infrared devices and the subsequent application of the whole machine. Its value directly reflects the modulation transfer performance of infrared devices to space targets and the spatial resolution of device imaging. It is an international standard for measuring infrared An important parameter of device imaging quality. When infrared detectors are used in important occasions such as aerospace, MTF parameters have become a key index parameter, and how to accurately measure the MTF value of infrared devices has b...

AI Technical Summary

Problems solved by technology

[0007] In order to solve the problem that the above-mentioned existing testing methods are not suitable for MTF testing of character-shaped linear infrared detectors, the present invention provides a method for testing the modulation transfer function of character-shaped linear infrared detectors with fast test speed and high accuracy. The method adopts the following technical solutions to realize:

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