Solid state disk error correction method and related device

Abstract

The invention discloses a solid state disk error correction method, which comprises the following steps: reading state information of a data block, and calculating data writing duration according to the state information; when the data writing duration is greater than a first preset duration, carrying out data transfer operation on the data block; when the data writing time length is smaller thanor equal to the first preset time length and larger than the second preset time length, determining the optimal voltage offset according to the result of the analog reading operation, modifying the reference voltage of the reading operation is modified according to the optimal voltage offset, and therefore when the data of the data block is read, carrying out reading operation according to the optimal voltage offset. The reference voltage of the reading operation is modified through the simulated optimal voltage offset, so that the reading error occurring when the data is read is corrected, the excessive use of the data transfer operation is avoided. The consumption of the system performance is reduced, and the performance utilization rate is improved. The invention further discloses a solid state disk error correction device, a storage device and a computer readable storage medium which have the above beneficial effects.

Description

technical field [0001] The present application relates to the field of computer technology, and in particular to a solid state disk error correction method, a solid state disk error correction device, a storage device, and a computer-readable storage medium. Background technique [0002] With the continuous development of information technology, various storage technologies have emerged. The solid-state hard disk with NAND particles as the storage medium is one of the storage technologies, which is low in cost and is often used for large-scale data storage. However, due to the electrical characteristics of NAND particles, there will be varying degrees of storage data error problems. Specifically, the higher the number of PEs, the higher the probability of reading errors. The higher the number of readings, the higher the probability of errors. In addition, the longer the data is stored in a fixed position, the higher the probability of data reading errors. high. Moreover, ...

AI Technical Summary

Problems solved by technology

However, in the prior art, the performance overhead consumed by data migration is relatively large. As long as the state of the data block storing the data reaches a certain threshold, the data migration operation is directly performed.

However, if the server is performing other data operations at this time, it will seriously affect the normal data operations

In addition, solid-state drives have data read and write life spans. If there are too many data movement operations, the lifespan of solid-state drives will be reduced.

Images