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Two-terminal vertical type 1t-dram and manufacturing method therefor

一种动态随机存取、制造方法的技术,应用在半导体器件、电固体器件、二极管等方向,能够解决面积广、阻塞等问题,达到克服物理限制的效果

Active Publication Date: 2019-07-16
IUCF HYU (IND UNIV COOP FOUND HANYANG UNIV)
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Moreover, in the 1T-DRAM based on the 3-terminal thyristor, when the p-base area is high (high), it can cause a latch-up effect to make the read state "1", and in the p-base area When it is low (low), it can cause blocking (blocking) so that the read status becomes "0"
[0010] Since the conventional 1-T DRAM based on the 3-terminal thyristor requires a gate terminal for applying current to the base region and is formed horizontally, it requires a large area, so there is a limitation in scaling down

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  • Two-terminal vertical type 1t-dram and manufacturing method therefor
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Embodiment Construction

[0043] Hereinafter, various embodiments of the present specification will be described with reference to the accompanying drawings.

[0044] It should be understood that the embodiments and the terms used are not intended to limit the technology described in this description to specific implementations, but include various modifications, equivalent technical solutions, and / or replacement technical solutions of the corresponding embodiments.

[0045] Hereinafter, in the description of various embodiments, when it is judged that the specific description of related known functions or structures makes the gist of the present invention unclear, the detailed description thereof will be omitted.

[0046] Also, terms described later are terms defined in consideration of functions in various embodiments, and may be changed according to user's, operator's intention, or custom. Therefore, its definition should be based on what is found throughout the specification.

[0047] With regard ...

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Abstract

A two-terminal vertical type 1T-DRAM and a manufacturing method therefor are disclosed. According to one embodiment of the present invention, the two-terminal vertical type 1T-DRAM comprises: a cathode layer formed as a first-type high-concentration semiconductor layer; a base region including a second-type low-concentration semiconductor layer formed on the cathode layer and a first-type low-concentration semiconductor layer formed on the second-type low-concentration semiconductor layer; and an anode layer formed as a second-type high-concentration semiconductor layer on the first-type low-concentration semiconductor layer.

Description

technical field [0001] The present invention relates to a two-terminal vertical type 1T-dynamic random access memory and its manufacturing method. Thyristor-based two-terminal vertical type 1T-Dynamic random access memory and method of manufacturing the same based on the doping concentration of the base region to perform memory operations. Background technique [0002] According to the prior art, a dynamic random access memory (DRAM) memory cell consists of a metal oxide semiconductor field effect transistor (Metal Oxide Silicon Field Effect Transistor, n-MOSFET) and a cylindrical (cylinder type) capacitor Composed of (capacitor), the design rules of DRAM storage unit transistors (for example: gate length) have reached the 20nm level, and the height of the cylindrical capacitor is about 1.5um, and has achieved up to 64 gigabytes (Giga Byte) ) integration. [0003] However, in order to make the integration level of the DRAM memory cell 1 terabit, it is necessary to form the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/108H01L29/78H01L27/102H01L27/24
CPCH01L29/78H01L29/87H01L27/1027H10B12/10H01L27/1021H01L29/7841H10B63/20H10B12/20H10B12/00
Inventor 朴在勤宋昇弦金旻源
Owner IUCF HYU (IND UNIV COOP FOUND HANYANG UNIV)
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