A method for comprehensive resistance identification of wheat varieties to head blight based on hyperspectral images

Abstract

The invention discloses a method for identifying comprehensive resistance to scab of wheat varieties based on hyperspectral images. The method takes wheat ears infected with scab of different varieties as the research object, and comprehensively uses hyperspectral imaging technology, spectroscopy, time Based on the knowledge in many fields such as sequence analysis and deep learning, it is proposed: the identification method for the resistance of wheat varieties in the non-infection period, the identification method for the resistance identification of wheat varieties after the onset, and the comprehensive identification method for wheat scab resistance. The present invention breaks through the defects of difficulty in resistance detection during the infection period, slow speed and low precision in manual identification operations, complex procedures and high costs in chemical methods, and not only provides a faster and more accurate method for identification of wheat scab resistance, but also can Resistance identification of wheat cultivars was carried out at the period when wheat was infected with Fusarium rubella but not infected.

Description

technical field [0001] The invention relates to the fields of detection and resistance identification of wheat scab, hyperspectral imaging technology, time series analysis and deep learning algorithm, and specifically relates to a method for comprehensive resistance identification of wheat variety scab based on hyperspectral images. Background technique [0002] Wheat is one of the three major grains in the world, and the problem of wheat diseases has become the focus of people's attention. Among them, wheat scab is a high-incidence fungal disease that threatens wheat production the most. Produces deoxynivalenol-based mycotoxins (Xu Fei; Effects of Different Infection Periods on the Occurrence of Wheat Scab and DON Accumulation in Grain), which causes severe yield loss and is secreted by Gibberella Mycotoxins can also seriously endanger human health and cause food safety problems. The yield loss of wheat caused by scab is severe, especially in the year when scab is prevale...

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Problems solved by technology

[0005] The purpose of the invention is to address the problems existing in the prior art, and propose a method for comprehensive resistance identification of wheat varieties scab based on hyperspectral images; As well as defects such as slow speed, low precision, and complex procedures and high costs in the manual resistance identification operation after the onset of the disease, it covers the detection of the initial onset time and the difference analysis of spectra and image features in the non-onset period of wheat scab infection and post-onset Level automatic grading detection, comprehensively considering the initial onset time of the non-onset period of infection and the average severity of the disease after onset, can comprehensively, quickly and accurately realize the comprehensive resistance identification of wheat varieties scab

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