A method for quickly displaying the distribution characteristics of specific crystal planes in polycrystalline materials
A technology of polycrystalline materials and distribution characteristics, applied in material analysis using radiation diffraction, material analysis using wave/particle radiation, material analysis, etc., can solve problems such as difficulties in single crystal preparation
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[0033] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0034] The sample material is Zircaloy-4 alloy. In order to study the influence of its specific crystal planes {0001}, {11-20} and {10-17} on the material properties, it is necessary to extract the specific crystal planes {0001}, {11-20 } and {10-17} crystal planes. In addition, in order to study the joint effect of different crystal planes on the properties of the alloy, it is also necessary to extract {0001} and {11-20} crystal planes, {0001} or {10-17} crystal planes , the {0001} crystal plane with an angle deviation of 5-10 degrees. A method for quickly presenting the distribution characteristics of a specific crystal plane of a polycrystalline material according to the present invention specifically includes the following steps:
[0035] 1. EBSD sample preparation
[0036] First, cut the EBSD sample (sample size is 10×8×3mm) by wire cut...
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