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A method for quickly displaying the distribution characteristics of specific crystal planes in polycrystalline materials

A technology of polycrystalline materials and distribution characteristics, applied in material analysis using radiation diffraction, material analysis using wave/particle radiation, material analysis, etc., can solve problems such as difficulties in single crystal preparation

Inactive Publication Date: 2021-12-17
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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Problems solved by technology

At present, the qualitative direction is mostly used to study the influence of specific crystal planes on material properties. Some researchers also use the method of preparing single crystals to study the influence of independent crystal grains on specific crystal planes on material properties. However, the preparation of single crystals is very difficult and impossible. It truly reflects the environment of the grains of the actual service materials and the interaction between them, so the research results may be highly subjective

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  • A method for quickly displaying the distribution characteristics of specific crystal planes in polycrystalline materials
  • A method for quickly displaying the distribution characteristics of specific crystal planes in polycrystalline materials
  • A method for quickly displaying the distribution characteristics of specific crystal planes in polycrystalline materials

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Embodiment Construction

[0033] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0034] The sample material is Zircaloy-4 alloy. In order to study the influence of its specific crystal planes {0001}, {11-20} and {10-17} on the material properties, it is necessary to extract the specific crystal planes {0001}, {11-20 } and {10-17} crystal planes. In addition, in order to study the joint effect of different crystal planes on the properties of the alloy, it is also necessary to extract {0001} and {11-20} crystal planes, {0001} or {10-17} crystal planes , the {0001} crystal plane with an angle deviation of 5-10 degrees. A method for quickly presenting the distribution characteristics of a specific crystal plane of a polycrystalline material according to the present invention specifically includes the following steps:

[0035] 1. EBSD sample preparation

[0036] First, cut the EBSD sample (sample size is 10×8×3mm) by wire cut...

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Abstract

The purpose of the present invention is to provide a method for quickly presenting the distribution characteristics of specific crystal planes of polycrystalline materials. This method has high efficiency, low cost, simple operation, and can accurately present the characteristics of multiple specific crystal plane orientations inside the polycrystalline material. The present invention mainly includes the steps of EBSD sample preparation, electron backscattering diffraction analysis technology to collect sample surface information, data processing and specific crystal face presentation; the present invention can be used for research on grain size, distribution and orientation relationship under specific crystal face characteristics , such as the study of the genetic orientation phenomenon of alloy materials during heat treatment and thermal processing; secondly, it can be used to explore the relationship between the oxidation resistance and corrosion resistance of materials and the distribution characteristics of specific crystal planes on the surface of materials; in addition, it can also be used to quantitatively study the The joint effects of different crystal planes and multiple specific crystal planes on material properties are used to guide the formulation of reasonable heat treatment and processing technology in actual production, so as to fully exert or improve the service performance of materials.

Description

technical field [0001] The invention belongs to the technical field of backscattered electron diffraction analysis and the field of material crystallography, and specifically relates to a method for rapidly presenting the distribution characteristics of specific crystal planes of materials by using electron backscattered diffraction (EBSD) technology. Background technique [0002] Most solid materials in nature, such as metals, ceramics, and minerals, are polycrystalline, which are composed of many individual independent grains. The crystal grains in polycrystalline materials, the distribution characteristics of the crystal plane orientation in the reference coordinate system are called orientation. Texture (also known as preferred orientation) will appear in the polycrystal when the orientations of the grains in the polycrystal gather together. Generally, materials will have a certain texture in the original state or after processing due to the influence of various externa...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/203G01N23/20
CPCG01N23/203G01N23/2005
Inventor 李阁平韩福洲刘承泽袁福森张英东郭文斌阿里·穆罕默德顾恒飞
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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