A Calculation Method of Coating Layer Thickness Based on Comprehensive Analysis of Multi-element X-ray Characteristic Spectrum

Abstract

The invention provides a coating and permeating layer thickness calculation method based on multi-element X-ray characteristic spectrum comprehensive analysis; based on an absorption method in an X-ray fluorescence detection technology, elements which are sensitive to the thickness of the coating and permeating layer are utilized by utilizing multiple X-ray characteristic spectrums, comprehensiveanalysis is carried out on various elements, a calculation method under multi-element comprehensive analysis is established, and the accuracy of a test result is guaranteed. The method is characterized in that the mutual compensation between various elements is utilized, so that the chance error caused by a single element is avoided, and the accuracy of a test result is improved.

Description

technical field [0001] The invention relates to a method for calculating the thickness of a coating layer, which belongs to the field of non-destructive testing. Background technique [0002] X-ray fluorescence testing technology is a kind of non-destructive testing technology widely used at present. It has the characteristics of convenience, speed and accuracy, and its application prospect is very broad. However, as far as the current situation is concerned, this technique is mainly used in the non-destructive testing of a single uniform coating with clear boundaries, and there is basically no relevant research on the detection of the thickness of the diffusion-type infiltrated layer. If only the original coating thickness calculation method is used to study the thickness of the diffusion-type infiltrated layer, the test results and the actual value will deviate greatly, and the accuracy will be greatly limited. [0003] At present, the detection of the thickness of the di...

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Problems solved by technology

However, as far as the current situation is concerned, this technique is mainly used in the non-destructive testing of a single uniform coating with clear boundaries, and there is basically no relevant research on the detection of the thickness of the diffusion-type infiltrated layer.

If only the original coating thickness calculation method is used to study the thickness of the diffusion-type infiltrated layer, the results obtained by the test will deviate from the actual value, and the accuracy will be greatly limited.

[0003] At present, the detection of the thickness of the diffusion-type infiltrated layer mainly relies on the method of cross-sectional scanning, that is, the sample is cut by wire, and then scanned and observed through an electron microscope, and the thickness of the infiltrated layer is measured according to the shape. However, this method is not only time-consuming , damage the integrity of the material, and only some products can be sampled for inspection, and the results of the sample inspection are more accidental

The disadvantage of using a single layer element for X-ray thickness detection is that the accuracy is low or a large amount of standard specimen data needs to be collected.

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