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On-line test device and on-line test method for time characteristics of embedded software

An embedded software and time-characteristic technology, applied in software testing/debugging, error detection/correction, instruments, etc., can solve problems such as large hardware operation requirements, low reliability, and error in test conclusions, so as to make up for the reliability of test results Low reliability, intuitive time measurement results, and the effect of avoiding time errors

Inactive Publication Date: 2019-08-20
BEIHANG UNIV
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AI Technical Summary

Problems solved by technology

This method takes a long time, requires a lot of hardware operations, and is easy to cause damage to the product due to some unpredictable situations (such as electrostatic breakdown of the chip)
Therefore, this method is difficult to operate, high risk, the measured data is not comprehensive, and the test conclusions obtained often have large errors and low reliability.

Method used

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  • On-line test device and on-line test method for time characteristics of embedded software
  • On-line test device and on-line test method for time characteristics of embedded software
  • On-line test device and on-line test method for time characteristics of embedded software

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Embodiment Construction

[0026] now attached Figure 1-3 The present invention is described in further detail:

[0027] A kind of online testing method of embedded software time characteristic, has adopted testing equipment EasyTime, and it comprises power control module, display control module, IO module, single-chip microcomputer system, and power control module carries out power supply management to testing equipment EasyTime; The interface is controlled, and the correct screen is displayed according to the user's button input instruction; the IO module can determine the data processing method according to the input type (RS422, or RS232 or others) selected by the user, and after receiving the data export instruction, it can Output the recorded data to the computer through USB; the single-chip microcomputer system is mainly responsible for calculating the time, and output the calculation results to the display control module for display.

[0028] A kind of online testing method of embedded softwar...

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Abstract

The invention provides an on-line test device and an on-line test method for time characteristics of embedded software, and the method comprises the following steps: 1, enabling a test device EasyTimeto be connected with a tested piece through a serial port, and enabling the tested piece to reside in tested software; step 2, inserting the time recording instruction into tested software, and outputting the time recording instruction in real time through a serial port for a test device EasyTime to collect, and burning a program; 3, operating tested software, designing a test scene, directly reading time parameters through performance test equipment EasyTime, wherein the read time parameters correspond to the software operation cycle number; and step 4, after the test is finished, exportingeach measured time through the test equipment EasyTime for software development personnel and test personnel to analyze and record. The method has the characteristics of simple operation, visual measurement result, small measurement error and the like.

Description

technical field [0001] The invention relates to an online testing device and an online testing method for time characteristics of embedded software, belonging to the technical field of embedded software testing. Background technique [0002] Embedded software is widely used in various fields. Although it has many advantages, it also has disadvantages such as poor software observability and difficult to expose faults. A large number of test equipment, test software and test methods are required for verification to ensure the quality of embedded software. [0003] At present, for the measurement of time characteristics of embedded software, it is usually necessary to unpack the hardware and connect the red and black probes of the oscilloscope to the chip, and output high and low levels to the oscilloscope through software plug-in to obtain various time performances of the embedded software. This method takes a long time, requires a lot of hardware operations, and is easy to ca...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 殷永峰张利坤李昆
Owner BEIHANG UNIV
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