Semiconductor chip test parameter verification system
A chip testing and verification system technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as complexity and inconvenient use, and achieve the effect of avoiding shaking and avoiding confusion
Inactive Publication Date: 2019-10-01
SUZHOU LINGSU ELECTRONICS TECH CO LTD
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Problems solved by technology
[0003] The purpose of the present invention is to provide a verification system for testing parameters of semiconductor chips, so as to solve the problem that the existing testing device proposed in the above-mentioned background technology is very complicated to load and very inconvenient to use
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[0013] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0014] see Figure 1-2 , an embodiment provided by the present invention: a verification system for semiconductor chip test parameters, including a workbench 1; an upper end of the workbench 1 is provided with a cylinder 3, and the bottom end of the cylinder 3 is fixed on the upper end of the workbench 1 by bolts. side, the front end of the cylinder 3 is provided with a piston rod 17, the front end of the piston rod 17 is provided with a moving plate 10, and t...
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The invention discloses a semiconductor chip test parameter verification system. The system comprises a workbench; an air cylinder is arranged at one end of the upward side of the workbench; a pistonrod is arranged at the front end of the air cylinder; a mobile plate is arranged at the front end of the piston rod; a base pin is arranged at the bottom end of the mobile plate; a bracket is arrangedat two ends of a sliding chute; a sliding bar is arranged on the upward side of the bracket; a driving disk is sleeved on the upward side of the sliding bar; an electric telescopic rod is arranged atthe bottom end of the driving disk; a data collector is mounted at the bottom end of the electric telescopic rod; a probe is mounted at the bottom end of the data collector; the output end of the probe is electrically connected with the input end of the data collector; the output end of the data collector is electrically connected with the input end of a display; and holding plates can be placedon the upward sides of the mobile plate, a finished product placing area and a to-be-detected placing area. When the system is used for testing semiconductor chips, a plurality of semiconductor chipscan be placed in holding grooves on the upward sides of the holding plates, so as to facilitate the feeding.
Description
technical field [0001] The invention relates to the technical field of chip testing for racing drones, in particular to a verification system for semiconductor chip test parameters. Background technique [0002] The racing drone is a drone that uses VR equipment to achieve real-time experience and uses remote control equipment to control the flight. Its semiconductor chip: a semiconductor device that can realize a certain function is made by etching and wiring on the semiconductor sheet. Not only silicon chips, common ones include gallium arsenide (gallium arsenide is poisonous, so some inferior circuit boards should not be curious to decompose it), germanium and other semiconductor materials. Semiconductor chips need to be tested during the production process. Existing test equipment The material is very complicated and very inconvenient to use. Contents of the invention [0003] The purpose of the present invention is to provide a verification system for testing parame...
Claims
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IPC IPC(8): G01R31/28
CPCG01R31/2891G01R31/2893
Inventor 罗佳文
Owner SUZHOU LINGSU ELECTRONICS TECH CO LTD