In-situ physical property test system and sample mounting method
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI
- Publication Date
- 2019-10-11
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Abstract
Description
technical field
[0001] The invention relates to the technical field of in-situ physical property testing, in particular to an in-situ physical property testing system and a sample installation method. Background technique
[0002] The design, preparation and characterization of quantum materials is an important research direction of "quantum control". The traditional method is to try many different materials to find the one that meets the needs, but this method has the defects of long cycle and low efficiency. To this end, existing methods are based on a deep understanding of material structure and physical properties, and materials are designed and prepared according to requirements to achieve precise manufacturing. However, as the dimension of the material decreases, the proportion of atoms on the surface of the material increases, and the exposure to the atmosphere will have a huge impact on the intrinsic properties of the material.
[0003] Vacuum interconnection is re...