Graphene in-plane bidirectional strain detection method and device
A detection method and graphene technology, applied in the field of mechanical measurement, can solve problems such as the inability to realize the decoupling analysis of flexible substrate materials, the difficulty in satisfying engineering requirements, and the inability to realize non-equivalent biaxial and two-direction strain decoupling measurement, etc.
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Embodiment 1
[0034] figure 1 It is a flow chart of the in-plane bidirectional strain detection method of graphene provided in Embodiment 1 of the present invention.
[0035] refer to figure 1 , the method includes the following steps:
[0036] Step S1, obtaining the graphene sample to be tested and a backscattered polarized Raman system;
[0037] Step S2, setting the sample coordinate system of the measured graphene sample under the backscattered polarized Raman system;
[0038] Specifically, refer to figure 2 , the measured graphene sample 1 is a single-layer single-crystal graphene, and its Zigzag (zigzag direction) and Armchair (armchair direction) constitute a crystal coordinate system, wherein Zigzag is the X axis (horizontal axis), and Armchair is the Y axis ( vertical axis).
[0039] The measured graphene sample 1 is in a two-dimensional strain state, and the two principal strains are respectively expressed by ε 1 and ε 2Indicates that ε 1 is the first principal strain, ε ...
Embodiment 2
[0068] image 3 It is a schematic diagram of an in-plane bidirectional strain detection device for graphene provided in Embodiment 2 of the present invention.
[0069]refer to image 3 , the device consists of:
[0070] The sample coordinate system acquisition unit 10 is used to acquire the sample coordinate system of the measured graphene sample, the backscattered polarized Raman system, and the measured graphene sample under the backscattered polarized Raman system;
[0071] The sample parameter acquisition unit 20 is used to acquire the parameters of the measured graphene sample, the parameters include crystal orientation angle, principal strain angle, phonon variable form factor and unstrained G peak Raman frequency shift;
[0072] The detection parameter setting unit 30 is used to set the incident light polarization angle and the scattered light polarization angle of the backscattered polarized Raman system, wherein the incident light polarization angle includes a first...
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