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Method and device for calibrating measurement time-delay of oscilloscope channel and calibration equipment

An oscilloscope and channel technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of high calibration cost and inaccurate calibration results

Active Publication Date: 2019-10-25
INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, the embodiment of the present invention provides a measurement delay method for calibrating an oscilloscope channel, so as to solve the delay correction method in the prior art, the correction result is not accurate enough, and the correction cost is high

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  • Method and device for calibrating measurement time-delay of oscilloscope channel and calibration equipment
  • Method and device for calibrating measurement time-delay of oscilloscope channel and calibration equipment
  • Method and device for calibrating measurement time-delay of oscilloscope channel and calibration equipment

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Embodiment 1

[0043] An embodiment of the present invention provides a measurement delay method for calibrating an oscilloscope channel, such as figure 1 shown, including the following steps:

[0044] Step S1: Obtain a switching dynamic waveform diagram for measuring the switching characteristics of the power semiconductor device under test. The power semiconductor device to be tested in this embodiment may be an insulated gate bipolar transistor (IGBT) or a semiconductor field effect transistor (MOSFET). The material of the power semiconductor device to be tested in this embodiment is preferably silicon carbide. The switching characteristics mentioned above are the switching loss characteristics of the power semiconductor device to be tested, and of course other switching characteristics can also be used.

[0045] The switching loss characteristics mentioned above are the losses that need to be reduced as much as possible during the working process of the power semiconductor device to be ...

Embodiment 2

[0073] An embodiment of the present invention provides a measurement delay method for calibrating an oscilloscope channel, which can also be applied to another equivalent test circuit. The method in Embodiment 1 figure 2 It is under ideal conditions, but in most applications, there will be parasitic parameters in the DC busbar and lines, especially in the case of small turn-on / off time, the influence of parasitic parameters cannot be ignored, it will be in the turn-on Oscillation occurs during shutdown. like Image 6 As shown, it is a specific situation in which the measurement delay is adjusted in consideration of parasitic parameters in this embodiment. Image 6 In order to consider the actual double-pulse model influenced by parasitic parameters, Lbus is the parasitic inductance of the DC busbar, Lin is the parasitic inductance inside the module, LG is the parasitic inductance of the drive circuit, Cpar is the parasitic capacitance of the load inductance and the junction ...

Embodiment 3

[0078] An embodiment of the present invention provides a measurement delay method for calibrating oscilloscope channels, which can also be applied to the situation where multiple channels of an oscilloscope are used to measure multiple electrical parameters at the same time, for example: the multiple electrical parameters are respectively the first electrical parameter to be measured is M1, the second electrical parameter to be measured is M2, and the third electrical parameter to be measured is M3. Based on the measurement delay method of calibrating the oscilloscope channel in Embodiment 1, after the measurement delay of the power semiconductor device to be tested is calibrated, it is obtained The relative delay time between the current to be measured and the voltage to be measured, according to the relative delay time, when the first electrical parameter to be measured is M1, the second electrical parameter to be measured is M2, and the third electrical parameter to be measur...

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Abstract

The invention discloses a method and device for calibrating measurement time-delay of an oscilloscope channel and calibration equipment. According to the method, a first waveform turning point of waveform turning of a switching dynamic waveform diagram of to-be-measured voltage and a second waveform turning point of waveform turning of to-be-measured current can be obtained on the basis of the condition that to-be-measured voltage and to-be-measured current, in the same driving state, of a to-be-measured power semiconductor device have waveform turning at the same time, and a difference between characteristic time and offset time is further calculated by combining the offset time corresponding to a relative offset position between the first waveform turning point and the second waveform turning point, so that relative time-delay between the to-be-measured voltage and the to-be-measured current in the same driving state can be accurately adjusted, the cost of the measurement time-delaycan be reduced, and meanwhile, the method, the device and the calibration equipment are suitable for being applied to the scene of measuring switching characteristics by a high-speed power switching device.

Description

technical field [0001] The invention relates to the technical field of oscilloscope calibration, in particular to a measurement delay method, device and calibration equipment for calibrating oscilloscope channels. Background technique [0002] An oscilloscope is a widely used electronic measuring instrument. It can convert invisible electrical signals into visible images, which is convenient for people to study the changing process of various electrical phenomena. Therefore, oscilloscopes are usually used to measure electrical physical quantities. For example, oscilloscopes can be used to measure current information and voltage information. Measuring current information or voltage information alone can be achieved using one channel of the oscilloscope, but for simultaneous measurement of voltage information and current information , you need to use two channels of the oscilloscope to realize it, and to measure two or more electrical physical quantities at the same time for i...

Claims

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Application Information

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IPC IPC(8): G01R35/00
CPCG01R35/002G01R35/005
Inventor 郑丹范涛温旭辉
Owner INST OF ELECTRICAL ENG CHINESE ACAD OF SCI