Unlock instant, AI-driven research and patent intelligence for your innovation.

A measurement delay method, device and calibration equipment for calibrating an oscilloscope channel

An oscilloscope and channel technology, applied in measurement devices, measuring electrical variables, instruments, etc., can solve the problems of inaccurate calibration results and high calibration costs, and achieve the effect of reducing costs

Active Publication Date: 2021-07-02
INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the embodiment of the present invention provides a measurement delay method for calibrating an oscilloscope channel, so as to solve the delay correction method in the prior art, the correction result is not accurate enough, and the correction cost is high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A measurement delay method, device and calibration equipment for calibrating an oscilloscope channel
  • A measurement delay method, device and calibration equipment for calibrating an oscilloscope channel
  • A measurement delay method, device and calibration equipment for calibrating an oscilloscope channel

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0043] An embodiment of the present invention provides a measurement delay method for calibrating an oscilloscope channel, such as figure 1 shown, including the following steps:

[0044] Step S1: Obtain a switching dynamic waveform diagram for measuring the switching characteristics of the power semiconductor device under test. The power semiconductor device to be tested in this embodiment may be an insulated gate bipolar transistor (IGBT) or a semiconductor field effect transistor (MOSFET). The material of the power semiconductor device to be tested in this embodiment is preferably silicon carbide. The switching characteristics mentioned above are the switching loss characteristics of the power semiconductor device to be tested, and of course other switching characteristics can also be used.

[0045] The switching loss characteristics mentioned above are the losses that need to be reduced as much as possible during the working process of the power semiconductor device to be ...

Embodiment 2

[0073] An embodiment of the present invention provides a measurement delay method for calibrating an oscilloscope channel, which can also be applied to another equivalent test circuit. The method in Embodiment 1 figure 2 It is under ideal conditions, but in most applications, there will be parasitic parameters in the DC busbar and lines, especially in the case of small turn-on / off time, the influence of parasitic parameters cannot be ignored, it will be in the turn-on Oscillation occurs during shutdown. Such as Figure 6 As shown, it is a specific situation in which the measurement delay is adjusted in consideration of parasitic parameters in this embodiment. Figure 6 In order to consider the actual double-pulse model influenced by parasitic parameters, Lbus is the parasitic inductance of the DC busbar, Lin is the parasitic inductance inside the module, LG is the parasitic inductance of the drive circuit, Cpar is the parasitic capacitance of the load inductance and the junc...

Embodiment 3

[0078] An embodiment of the present invention provides a measurement delay method for calibrating oscilloscope channels, which can also be applied to the situation where multiple channels of an oscilloscope are used to measure multiple electrical parameters at the same time, for example: the multiple electrical parameters are respectively the first electrical parameter to be measured is M1, the second electrical parameter to be measured is M2, and the third electrical parameter to be measured is M3. Based on the measurement delay method of calibrating the oscilloscope channel in Embodiment 1, after the measurement delay of the power semiconductor device to be tested is calibrated, it is obtained The relative delay time between the current to be measured and the voltage to be measured, according to the relative delay time, when the first electrical parameter to be measured is M1, the second electrical parameter to be measured is M2, and the third electrical parameter to be measur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a measurement delay method, device and calibration equipment for calibrating an oscilloscope channel, wherein the method can be based on the fact that the voltage to be measured and the current to be measured have a waveform turning point at the same time in the same driving state of the power semiconductor device to be tested, and then obtained The switching dynamic waveform diagram of the voltage to be measured is the first waveform turning point at which the waveform turns and the second waveform turning point at which the current to be measured turns. Shift time, calculate the difference between the characteristic time and the shift time, can accurately adjust the relative delay between the measured voltage and the measured current in the same driving state, and can reduce the cost of measurement delay, while suitable for It is applied in the scenario of measuring switching characteristics of high-speed power switching devices.

Description

technical field [0001] The invention relates to the technical field of oscilloscope calibration, in particular to a measurement delay method, device and calibration equipment for calibrating oscilloscope channels. Background technique [0002] An oscilloscope is a widely used electronic measuring instrument. It can convert invisible electrical signals into visible images, which is convenient for people to study the changing process of various electrical phenomena. Therefore, oscilloscopes are usually used to measure electrical physical quantities. For example, oscilloscopes can be used to measure current information and voltage information. Measuring current information or voltage information alone can be achieved using one channel of the oscilloscope, but for simultaneous measurement of voltage information and current information , you need to use two channels of the oscilloscope to realize it, and to measure two or more electrical physical quantities at the same time for i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
CPCG01R35/002G01R35/005
Inventor 郑丹范涛温旭辉
Owner INST OF ELECTRICAL ENG CHINESE ACAD OF SCI