Servo adjustable pendulum impact tester

An impact testing and adjustable technology, applied in impact testing, machine/structural component testing, measuring devices, etc., can solve the problems of inaccurate test results, poor equipment, unsatisfactory, etc., and achieve high test efficiency and test results. The effect of accurate and convenient loading and unloading operations

CN110441019AInactive Publication Date: 2019-11-12武汉阿李智能科技有限公司
0 Cites 2 Cited by

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
Publication Date
2019-11-12
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention belongs to the technical field of electronic testing devices, in particular to a servo adjustable pendulum impact tester. The servo adjustable pendulum impact tester comprises a rack assembly, a feeding mechanism, a clamp assembly and a pendulum clock mechanism, wherein the rack assembly comprises a bottom plate; a machine frame is fixedly arranged at the top of the bottom plate; thefeeding mechanism is fixed on the bottom plate and is used for driving a chip to move in the machine frame; the clamp assembly is fixed on the feeding mechanism and is used for fixing a to-be-testedchip; and the pendulum clock mechanism is fixed on the bottom plate. According to the servo adjustable pendulum impact tester, the to-be-tested chip is fixed by using the clamp assembly, and then theclamp assembly is driven to move in the machine frame by adopting the feeding mechanism, so that loading and unloading operations of an operator are facilitated; and the chip on the clamp assembly issubjected to impact test by using the pendulum clock mechanism and the impact test process is shot and recorded through a shooting mechanism, so that the servo adjustable pendulum impact tester has the advantages of high test efficiency and an accurate test result when strength impact test is carried out on the chip by adopting the servo adjustable pendulum impact tester.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the technical field of electronic testing devices, in particular to a servo-adjustable pendulum impact testing machine. Background technique

[0002] After the chip production is completed, in order to ensure that the chip and other electronic components are assembled into an electronic product, the electronic product is not easily damaged after being impacted, and the impact performance of the finished chip needs to be tested. At present, the main impact tests are thermal shock test and strength Impact test, including hot and cold shock test and the most complete testing equipment, force impact test mainly tests the bonding strength between CG and the sensor bonded on CG, but the current force impact test equipment is poor, on the one hand, the test efficiency is low , unable to meet the needs of the actual test, on the one hand, the test effect is not ideal, resulting in inaccurate test results, because the present invention ...

Examples

Embodiment

[0029] see Figure 1-9 , the present invention provides the following technical solutions: a servo-adjustable pendulum impact testing machine, comprising: a frame assembly 1; the frame assembly 1 includes a bottom plate 101, and the top of the bottom plate 101 is fixedly installed with an organic frame 102; a feeding mechanism 2, a feeding mechanism 2 is fixed on the bottom plate 101, which is used to drive the chip to move in the machine frame 102; the clamp assembly 3, which is fixed on the feeding mechanism 2, is used to fix the chip to be tested; the pendulum clock mechanism 4, The pendulum clock mechanism 4 is fixed on the base plate 101, and it is used for impact testing the chip on the fixture assembly 3; the photographing mechanism 5, the photographing mechanism 5 is fixed on the base plate 101, and it is used for photographing and recording the chip in the impact test.