Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for detecting integrity of CT secondary circuit

A secondary loop and integrity technology, applied in measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as on-off measurement of multimeters with poor contact, so as to facilitate fault finding, reduce the risk of poor contact, and reduce heat generation. The effect of the risk of burning the terminals

Inactive Publication Date: 2019-11-22
GUANGDONG POWER GRID CO LTD +1
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a device and method for detecting the integrity of the CT secondary circuit in order to overcome the problems of poor contact caused by frequent untwisting and connecting of the connecting piece and the great limitations of the on-off measurement of the multimeter.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for detecting integrity of CT secondary circuit
  • Device and method for detecting integrity of CT secondary circuit
  • Device and method for detecting integrity of CT secondary circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0062] like figure 1 As shown, the main device 1 includes a host 11, a current clamp meter 12 and an adjustable DC voltage source 13; wherein:

[0063] The current clamp 12 includes an A-phase current clamp 121, a B-phase current clamp 122 and a C-phase current clamp 123; the current clamp 12 is electrically connected to the host 11; the adjustable DC voltage source 13 is connected to the CT secondary circuit to provide voltage for the entire secondary circuit detection circuit.

[0064] The host 11 includes a DC output positive test lead 111, a DC output negative test lead 112, a housing 113, a storage battery 114, a result output display screen 115, a DC output display screen 116, a power adjustment button 117 and an output positive and negative sign 118; wherein:

[0065] The DC output positive test lead 111 and the DC output negative test lead 112 are electrically connected to the circuit module; the battery 114, the result output display screen 115, the DC output display s...

Embodiment 2

[0070] like figure 2 As shown, the circuit module 2 includes a push-pull DC / DC converter 21, a rectification filter circuit 22, a feedback control circuit 23, a single-chip microcomputer 24 and an analog-to-digital conversion circuit 25; wherein: the push-pull DC / DC converter 21 output terminals are electrically connected to the input terminals of the rectification filter circuit 22; the output terminals of the rectification filter circuit 22 are respectively electrically connected to the input terminals of the single-chip microcomputer 24 and the input terminals of the feedback control circuit 23; the output terminals of the single-chip microcomputer 24 end is electrically connected to the input end of the feedback control circuit 23; the output end of the feedback control circuit 23 is electrically connected to the input end of the DC / DC converter 21; the single-chip microcomputer 24 is electrically connected to the analog-to-digital conversion circuit 25 sexual connection....

Embodiment 3

[0075] like image 3 As shown, each group of CT secondary circuits includes ABCN phases, and the CTs connected in series to primary equipment have multiple secondary windings, which are divided into groups such as protection, measurement and control, and measurement according to functions. The CT secondary circuits pass through the CT secondary junction box It is introduced into the terminal block of the field terminal box through underground cables, and then connected to the protection and measurement and control devices in the protection room. The resistance of the circuit from the secondary side of the CT to the disconnected phase is about 0.5Ω, and the resistance from the terminal box to the protection, measurement and control device is even smaller, within 0.2Ω. The same-named ends of the ABC three-phase windings are respectively connected to the protection device, and then flow back through the N-phase to form a complete circuit. The N-terminals of the three-phase windin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device and method for detecting the integrity of a CT secondary circuit. The detection principle is that the integrity of each phase of a current circuit can be judged by comparing the current data with each other according to the principle that three-phase electrical parameters of each group of CT circuits are completely symmetrical and that characteristic that the resistance of the CT circuits is extremely small. According to the device and the method provided by the invention for detecting the integrity of the CT secondary circuit, the integrity of the ABC three-phase current circuit can be judged only by disconnecting the wiring terminal on one side of the N-phase connecting piece, so that the workload is greatly reduced, the operation mode that a connecting piece needs to be disconnected and the CT secondary circuit needs to be switched on and off at the left and right sides is changed, and the risk of poor contact is greatly reduced; based on the principle that the electrical parameters of the CT secondary circuit are completely symmetrical, the three states of disconnection, poor contact and complete connection of any circuit can be accurately judged, faults can be found conveniently during acceptance check, and the risk that terminals are burnt due to heating caused by poor contact of the CT secondary circuit is reduced.

Description

technical field [0001] The invention relates to the field of circuit detection, in particular to a device and method for detecting the integrity of a CT secondary circuit. Background technique [0002] The second-wire cables of CT are led from the secondary junction box to the terminal box of the site through the cable trench, and then connected to the protection, measurement and control, security and other screen cabinets in the functional room after being converged by the terminal block to form a complete current loop. Before replacing the CT loop cable and putting it into operation, it is necessary to check the integrity of the CT loop to prevent disconnection or poor contact from causing high voltage on the secondary side to burn the terminal. [0003] At present, the method of detecting the integrity of the circuit is to untie the connecting piece on the terminal block, and use the on-off gear of the multimeter to measure the on-off of the circuit on both sides of the t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02
Inventor 邓胜初于胜洋谭志聪刘秀甫刘耀晋肖赛军董晓伟刘继旸黄道弟曾斌陈文娟
Owner GUANGDONG POWER GRID CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com