A deep ultraviolet angle-resolved photoelectron spectroscopy light source with spatial resolution

A photoelectron spectroscopy and spatial resolution technology, applied in circuits, lasers, analytical materials, etc., to achieve the effects of easy maintenance, high energy resolution, and good spatial resolution

Active Publication Date: 2020-07-17
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

However, limited by the work function of metal materials, only laser light sources in the deep ultraviolet band have the ability to excite photoelectrons in material materials, but laser transmission in this band is greatly affected by water vapor absorption and attenuation. Under these conditions, the optical path system for deep ultraviolet lasers has great application value for the realization of ARPES light sources with both high energy resolution and high spatial resolution.

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  • A deep ultraviolet angle-resolved photoelectron spectroscopy light source with spatial resolution

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Embodiment 1

[0027] A deep ultraviolet angle-resolved photoelectron spectroscopy light source with spatial resolution capability, its structure is as follows figure 1 As shown, it includes a sequentially connected continuous laser 1, a fundamental frequency light adjustment module, a deep ultraviolet laser generation module, a deep ultraviolet laser shaping and collimation module, and a deep ultraviolet laser function realization module; 1. The fundamental frequency optical power and polarization direction of the generated laser are adjusted; the deep ultraviolet laser generation module includes a KBBF crystal 11, which is used to construct the interaction between the fundamental frequency light and the KBBF crystal 11 for the laser adjusted by the fundamental frequency light adjustment module. The requirements for high-frequency lasers include the necessary environment to meet the excitation power threshold and phase matching conditions. The matching conditions refer to the lattice matchin...

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Abstract

A deep ultraviolet angle resolution photoelectron spectroscopy light source with the spatial resolution capability is provided and comprises a continuous laser (1), a fundamental frequency light adjusting module, a deep ultraviolet laser generating module, a deep ultraviolet laser shaping and collimating module and a deep ultraviolet laser function achieving module which are connected in sequence,and the last three modules are arranged in a vacuum cavity. The fundamental frequency light adjusting module is mainly used for adjusting the power and polarization direction of fundamental frequencylight output by the continuous laser (1); the deep ultraviolet laser generating module is used for constructing a necessary environment required for generating frequency doubling laser through interaction of fundamental frequency light and the KBBF crystal; the deep ultraviolet laser shaping and collimating module is used for carrying out beam shaping and beam expanding collimation on the frequency doubling laser; and the deep ultraviolet laser function achieving module is used for adjusting the polarization characteristic of the deep ultraviolet laser and then carrying out sub-micron focusing on the deep ultraviolet laser. The light source constructed by the invention has high energy resolution capability and high spatial resolution capability at the same time.

Description

technical field [0001] The invention generally belongs to the technical field of high ultra-vacuum condensed matter physical characterization, and specifically relates to a deep ultraviolet angle-resolved photoelectron energy spectrum light source with spatial resolution capability. Background technique [0002] ARPES (Angle-resolved photoemission spectroscopy, angle-resolved photoemission spectroscopy) is a method that usually uses synchrotron radiation or laser as a probe light source and uses the principle of photoelectric effect to directly detect the space electronic band structure (electron number density distribution) of solids. experimental method. It can give information about the direction, velocity and scattering process of the valence electrons in the studied sample (usually a single crystal material), that is, obtain information about the energy and momentum of the electrons, and thus obtain detailed features about the energy band dispersion and the Fermi surfac...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01S3/109H01S3/10G01N23/2273
CPCG01N23/2273H01S3/10H01S3/10061H01S3/109
Inventor 张超凡毛元昊郭川黄坤陈宇林
Owner NAT UNIV OF DEFENSE TECH
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