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Transformer testing method and related device

A transformer and device technology, applied in the field of transformer testing methods and related devices, can solve the problems of transformer RE characteristic test failure, automatic interception of bad transformers, etc., to achieve the effect of automatic interception and product quality assurance

Active Publication Date: 2022-04-22
HUAWEI DIGITAL POWER TECH CO LTD
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  • Claims
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Problems solved by technology

[0006] The embodiment of the present invention discloses a transformer testing method and related devices, which can solve the problem in the prior art that the RE characteristic test of the transformer fails due to the limitation of the manufacturing process, and can realize automatic interception of bad transformers and ensure the product quality of the transformer

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  • Transformer testing method and related device
  • Transformer testing method and related device
  • Transformer testing method and related device

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Embodiment Construction

[0039] The technical solutions in the embodiments of the present invention will be described in detail below with reference to the accompanying drawings of the present invention.

[0040] During the process of filing the present application, the applicant found that: in the prior art, the transformer cannot pass the RE test due to the influence of the transformer manufacturing process. To solve this problem, the present application proposes a transformer testing method and a device to which the method is applicable. Specifically, the present application can use a peripheral circuit that cooperates with the transformer to control the RE characteristics of the transformer, so as to intercept transformers that do not meet the specifications (ie, defective transformers). see first image 3 , is a schematic diagram of a possible transformer test scenario provided by an embodiment of the present invention.

[0041] like image 3 The schematic diagram of the scenario shown includes ...

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Abstract

The embodiment of the present invention discloses a transformer testing method and related devices. The transformer is carried on the PCB main board to test the radiation interference RE. The transformer is composed of a primary coil and a secondary coil coupled to each other. The method includes: The analyzer acquires scattering parameters between a first port and a second port, the first port being any one of the two ports of the primary winding in the primary coil, and the second port being the secondary coil Any one of the two ports of the main winding; if the scattering parameter is greater than or equal to a preset threshold, it is determined that the transformer is a defective transformer. By adopting the embodiments of the present invention, problems in the prior art such as failure of the RE characteristic test due to the limitation of the transformer manufacturing process can be solved.

Description

technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a transformer testing method and related devices. Background technique [0002] With the development of fast charging technology, the power parameter requirements of switching power supply are getting higher and higher, resulting in more and more complicated design structure of transformer. Especially, for the transformer of high-frequency power supply, the transformer winding structure is complex, the processing steps are many, and some of the steps are completed manually. Among them, factors such as the flatness of the enameled wire in the transformer winding, the filling of the wire slot and the offset have a great influence on the radiation emission (RE) characteristics in the electromagnetic compatibility (EMC), and these factors are It is unavoidable artificially, which will lead to the failure to pass the RE characteristic test of the transformer, which will h...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 王庆海赵为阳赵龙戴勇军
Owner HUAWEI DIGITAL POWER TECH CO LTD
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