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Competitive allele-specific polymerase chain reaction markers of leaf rust resistance loci in durum wheat and their applications

An allele-specific, durum wheat technology, applied in the determination/inspection of microorganisms, biochemical equipment and methods, DNA/RNA fragments, etc., can solve the hidden dangers of wheat production and the easy loss of disease resistance genes at the seedling stage etc. to achieve good specificity, high resolution, and enhanced selection

Inactive Publication Date: 2021-03-02
HUAZHONG AGRI UNIV
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  • Abstract
  • Description
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Problems solved by technology

Because the disease resistance of the disease resistance gene at the seedling stage is easy to lose, there is a very big hidden danger in wheat production

Method used

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  • Competitive allele-specific polymerase chain reaction markers of leaf rust resistance loci in durum wheat and their applications
  • Competitive allele-specific polymerase chain reaction markers of leaf rust resistance loci in durum wheat and their applications
  • Competitive allele-specific polymerase chain reaction markers of leaf rust resistance loci in durum wheat and their applications

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Embodiment Construction

[0022] In order to make the purpose, technical solutions and beneficial effects of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples.

[0023] With the continuous development of SNP genotyping detection technology, KASP has been widely used in experiments because of its simple operation, fast and low cost (Christopherson et al.1997; Huang et al.1992; Stadhouders et al.2010). The invention provides KASP markers BA00138075 and BA00606902 located at the resistance site QLr.hzau-1BL on the 1BL chromosome.

[0024] Example Molecular markers BA00138075 and BA00606902 of durum wheat leaf rust gene and acquisition of special primers thereof

[0025] Source of biological material:

[0026] Durum wheat material: Courtesy of the International Maize and Wheat Improvement Center. 148 copies of Heller#1 / Atred#2 and 148 copies of Dunkler / Atred#2 involved two F 5 The first generation recombinant inbred line po...

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Abstract

The invention provides wheat leaf rust resistance-related KASP molecular markers and application thereof. The KASP molecular markers are selected from BA00138075 and / or BA00606902, wherein base sequences of BA00138075 and BA00606902 are as shown in a table 1 as shown in the specification respectively. According to the provided KASP molecular markers, the selectivity of a locus can be enhanced, theaccuracy of selection of a leaf rust-resistant breeding material is improved, and the provided KASP molecular markers have important significance for achieving molecular marker-assisted selection breeding and improving the selection efficiency of durum wheat breeding.

Description

technical field [0001] The invention relates to the field of biotechnology, in particular to a competitive allele-specific polymerase chain reaction marker related to durum wheat leaf rust resistance and its application. Background technique [0002] Durum wheat leaf rust is a very widespread and endemic fungal disease caused by the infection of wheat leaf rust (Puccinia triticina). Leaf rust mainly infects the leaves of wheat, and produces irregular piles of reddish-brown uredospores on the infected leaves. Leaf rust is prevalent in major durum wheat producing regions worldwide and can cause yield losses of 15-40%. In my country, leaf rust is not only prevalent in the warm and humid southwestern wheat region and the Yangtze River Basin wheat region, but also can cause serious economic losses in the cold and dry North China wheat region and Northeast wheat region. [0003] Breeding disease-resistant varieties and chemical control can effectively resist the prevalence of du...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C12Q1/6895C12N15/11
CPCC12Q1/6895C12Q2600/13C12Q2600/156
Inventor 兰彩霞李志康袁婵
Owner HUAZHONG AGRI UNIV
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