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33 results about "Wheat leaf rust" patented technology

Wheat leaf rust is a fungal disease that affects wheat, barley and rye stems, leaves and grains. In temperate zones it is destructive on winter wheat because the pathogen overwinters. Infections can lead up to 20% yield loss, which is exacerbated by dying leaves, which fertilize the fungus. The pathogen is Puccinia rust fungus. Puccinia triticina causes "black rust", P. recondita causes "brown rust", and P. striiformis causes "yellow rust". It is the most prevalent of all the wheat rust diseases, occurring in most wheat growing regions. It causes serious epidemics in North America, Mexico and South America and is a devastating seasonal disease in India. All three types of Puccinia are heteroecious requiring two distinct and distantly related hosts (alternate hosts). Rust and the similar smut are members of the class Pucciniomycetes but rust is not normally a black powdery mass.

Colloidal gold test strip used for detecting wheat leaf rust

The invention provides a colloidal gold test strip used for detecting wheat leaf rust. The colloidal gold test strip comprises a sample pad, a colloidal-gold pad, an NC membrane, absorbent paper and a PS base plate, wherein the sample pad, the colloidal-gold pad, the NC membrane and the absorbent paper are successively arranged on the PS base plate along the chromatographic direction of a sample, the colloidal-gold pad is coated by a colloidal gold-labeled monoclonal antibody against Puccinia triticina, the NC membrane successively comprises a detection line and a quality control line along the chromatographic direction of the sample, the detection line is coated with Puccinia triticina antigen protein that the monoclonal antibody can specifically recognize, and the quality control line is coated with a goat anti-mouse secondary antibody. The monoclonal antibody against Puccinia triticina is secreted by a hybridoma cell with an accession number of CGMCC No. 10884. When the test strip is used for detection, the process from sampling to obtainment of detection results only takes 15 min, operation is simple and convenient, the results are accurate, early warning of wheat leaf rust can be realized, and economic loss caused by diseases is reduced.
Owner:INST OF PLANT PROTECTION CHINESE ACAD OF AGRI SCI

Method for improving dcaps marker detection efficiency

The invention provides a method for improving dcaps marker detection efficiency, and relates to the technical field of molecular biology. The method for improving the dcaps marker detection efficiencycomprises the following steps: S1, selecting a target gene sequence: extracting a known wheat leaf rust resistance gene Lr67 and a wild type susceptibility gene thereof; S2, designing a dCAPS primer:extracting the wheat leaf rust resistance gene Lr67 in S1 to be matched with dCAPS Finder2.0 equipment to prepare a primer with a normal sequence length; and S3, amplifying the primer sequence length: amplifying the primer prepared in S2. According to the method for improving the dcaps marker detection efficiency, enzyme cutting sites are introduced into primers of dCAPS, and the length of the primers is generally about 20 bp, so that fragments which are about 20 bp shorter than original fragments are generated after PCR enzyme cutting, and polyacrylamide gel electrophoresis is generally adopted for separation so as to distinguish the difference of the fragments of 20 bp. According to the invention, a tail sequence of 30bp or above is added to the 5' end of each primer, so that the fragment size difference between a wild type and a mutant after enzyme digestion is increased to 50bp or above.
Owner:CROP RES INST SHANDONG ACAD OF AGRI SCI
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