Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Indel molecular marker of wheat leaf rust resistance gene Lr13 and application thereof

A technology of leaf rust resistance gene and molecular marker, which is applied in the field of biogenetics, can solve the problems of easy loss of resistance and difficulty in the existence of disease resistance genes, and achieve the effect of improving selection efficiency

Active Publication Date: 2020-04-21
CHINA AGRI UNIV
View PDF10 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the most economical, environmentally friendly and effective way to control wheat leaf rust is to breed disease-resistant varieties. Varieties with a single source of resistance tend to lose resistance in production. Polymerizing multiple disease-resistant genes in one material can maintain the production and application of wheat. Durable resistance, but it is very difficult to determine the presence or absence of resistance genes through phenotypic selection in breeding, especially when there is more than one resistance gene in the same material

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Indel molecular marker of wheat leaf rust resistance gene Lr13 and application thereof
  • Indel molecular marker of wheat leaf rust resistance gene Lr13 and application thereof
  • Indel molecular marker of wheat leaf rust resistance gene Lr13 and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] The invention provides a method for screening molecular markers of wheat leaf rust resistance, specifically as follows:

[0030] 1. Genetic analysis

[0031] F 2 Phenotypic identification of individual plants in the population, F 2 The population contained 3057 individuals, of which 2300 were resistant and 757 were susceptible. F 2 The population contained 851 individual plants, including 624 resistant individual plants and 227 susceptible individual plants. Use SPSS to carry out chi-square test (suitability test) to the phenotype results. When the expected ratio is 3:1, the chi-square values ​​are 0.092 and 1.268, P>0.05 (Table 2), and the resistance of Liaochun 10 is obtained. Leaf rust traits are controlled by a dominant single gene. Liaochun 10 and F derived from RL4031(Lr13) 2 All 1395 individual plants in the population were resistant to the disease, and it was concluded that the leaf rust resistance gene in Liaochun 10 was Lr13.

[0032] Table 1 Leaf rust i...

Embodiment 2

[0042] In this example, the indel molecular marker Lseq102 was used to screen 33 materials known to contain or not contain Lr13. The specific steps are as follows:

[0043] 1. Using the CTAB method to extract DNA from leaf tissues of 33 wheat materials.

[0044] 2. Using the genomic DNA extracted in step 1 as a template, a primer pair consisting of a single-stranded DNA molecule (upstream primer) shown in sequence 1 and a single-stranded DNA molecule (downstream primer) shown in sequence 2 in table 3 is used for PCR amplification. increase.

[0045] PCR amplification reaction system (10μl system): template DNA (50ngμL -1 ) 2.0 μL, 2×PCR Mix 5.0 μL (GenStar company product), upstream primer 1 μL, downstream primer 1 μL, ddH 2 O 1.0 μL.

[0046] The reaction program of PCR amplification: 94°C for 5min; 35 cycles of 94°C for 30s, 56°C for 30s, and 72°C for 30s; 72°C for 5min.

[0047] Table 3 The upstream and downstream primer sequences of Indel molecular marker Lseq102

[0...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an indel molecular marker of a wheat leaf rust resistance gene Lr13 and an application of the indel molecular marker. The indel molecular marker is located at the 1577558888thsite of a wheat 2B chromosome, and the nucleotide sequence of the indel molecular marker is shown in the formula of SEQ ID NO.1. According to the invention, genetic analysis is carried out on disease-resistant and susceptible wheat, the interval position of the leaf rust resistance gene Lr13 is determined by constructing a genetic linkage map, an indel molecular marker linked with the gene is correspondingly developed, the indel molecular marker is highly linked with the wheat leaf rust resistance gene Lr13, a wheat strain containing the wheat leaf rust resistance gene Lr13 can be screened out through the indel molecular marker, the selection efficiency is improved, the wheat disease-resistant breeding process is accelerated, and the purpose of polymerization breeding of multiple disease-resistant genes is achieved.

Description

technical field [0001] The invention relates to the field of biogenetics, in particular to an indel molecular marker of wheat leaf rust resistance gene Lr13 and its application. Background technique [0002] Wheat leaf rust is a fungal disease caused by the infection of wheat leaf rust (Puccinia triticina), which seriously affects the production of wheat. Wheat leaf rust will reduce the yield by 3% when the disease is mild, and it will reach 25-30% when the disease is severe, and the severity of the disease is positively correlated with the loss of yield. [0003] At present, the most economical, environmentally friendly and effective way to control wheat leaf rust is to breed disease-resistant varieties. Varieties with a single source of resistance tend to lose resistance in production. Polymerizing multiple disease-resistant genes in one material can maintain the production and application of wheat. Durable resistance, but it is very difficult to determine the presence or...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C12Q1/6895C12N15/11
CPCC12Q1/6895C12Q2600/13C12Q2600/156Y02A40/10
Inventor 解超杰胡兆荣邱丽娜孙其信马骏
Owner CHINA AGRI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com