This invention discloses a method for synergistic improvement of wheat quality and
disease resistance based on the creation and utilization of the T1DL.1VS translocation line. Addressing the problem of low breeding efficiency caused by the dispersion of
disease resistance and quality genes, this invention creates a novel T1DL.1VS translocation line that aggregates Pm67 / Glu-V1 by crossing the T1DL.1V#4S translocation line NAU195 carrying Glu-V1 with the T1DL.1V#5S translocation line NAU196 carrying Pm67. Recombinant single plants are screened in the F2 generation. Furthermore, utilizing the co-segregation characteristic of this translocation line with the
wax repressor gene IW-V1, a dual-
marker selection system combining morphological markers and the NAU1VS-1
molecular marker is established and introduced into a high-yielding variety background. This translocation line has no significant negative effect on yield traits, and the newly bred lines exhibit
high resistance to
powdery mildew and significantly improved bread
processing quality, achieving synergistic and efficient improvement of wheat
disease resistance and
processing quality.