Grading method of wheat leaf rust based on infrared thermal imaging edge detection

A technology of infrared thermal imaging and edge detection, which is applied in image data processing, image analysis, image enhancement, etc., to achieve the effects of early detection of diseases, improvement of accuracy and stability, and improvement of intelligent management level

Inactive Publication Date: 2019-02-26
JIANGSU UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, there are few studies on crop disease classificati

Method used

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  • Grading method of wheat leaf rust based on infrared thermal imaging edge detection
  • Grading method of wheat leaf rust based on infrared thermal imaging edge detection
  • Grading method of wheat leaf rust based on infrared thermal imaging edge detection

Examples

Experimental program
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Embodiment

[0033] 1. Sample cultivation and virus inoculation

[0034] The cultivation of wheat samples was carried out in the artificial intelligence growth room of the College of Agricultural Life and Environmental Sciences, University of Alberta North Campus, Canada. figure 1 shown in a. The setting conditions are as follows, temperature range: maximum 15℃, minimum 11℃; light: 12h during the day and 12h at night; light intensity: 10000lux, humidity range: 60-70%. The selected wheat variety is the Canadian spring wheat susceptible variety Peace. Spray inoculation when wheat grows to two true leaves, such as figure 1 Shown in b. The inoculation steps are: ① Wet the inner wall of the growth chamber with distilled water, and allow the wheat to equilibrate in a humid space for about 30 to 45 minutes. ②Prepare and configure leaf rust (Puccinia triticina) fungal spore spray. First, take out the vial containing orange-red powdery spores from the ultra-low temperature refrigerator, place it in ...

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Abstract

The invention discloses a method for grading wheat leaf rust based on infrared thermal imaging edge detection processing, which relates to the technical field of wheat rust detection. Firstly, the infrared thermogram of the whole wheat sample was collected to calculate the average leaf temperature of healthy plants, incubated plants and symptomatic plants, respectively, and to find out the temperature change rule in the process of fungal invasion. Then the regions of infrared thermogram which were pretreated by histogram equalization and median filter were extracted from the infrared thermogram. The proportion of lesion area in the total thermal imaging area of the whole plant was calculated by dividing the temperature region, extracting the low temperature region and segmenting the threshold value. The correlation coefficient was 0.9755, RMSE was 9.79%, and the overall recognition rate was 90%. Compared with the general near-infrared detection method, the invention has the advantagesof fast detection speed and earlier detection of diseases.

Description

Technical field [0001] The invention relates to the technical field of detection of wheat rust, in particular to a method for grading wheat leaf rust by infrared thermal imaging edge detection processing. Background technique [0002] Wheat rust is a huge hazard to our country's wheat production. The rapid monitoring and classification of wheat rust is the basis for scientific production management, and it is also a prerequisite for early application of pesticides. Wheat is often attacked by diseases during the growth process, resulting in a reduction in yield, and in severe cases, it will never yield. There are about 200 kinds of wheat diseases officially recorded in the world. There are more than 60 kinds of wheat diseases reported in our country, and 38 kinds are common. The important ones are wheat rust (strip rust, leaf rust, stalk rust), powdery mildew, leaf blight, head blight , Total erosion, sheath blight, smut, leaf spot and root rot, etc. Among them, leaf diseases fr...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/13G06K9/62
CPCG06T7/0002G06T7/13G06T2207/30168G06T2207/30188G06T2207/10048G06F18/2135G06F18/2411
Inventor 朱文静李林李晋阳刘继展魏新华毛罕平
Owner JIANGSU UNIV
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