Sample preparation process method

Abstract

The invention provides a sample preparation process method. The process method comprises the following steps of: cutting steel with surface defects to form a sample to be detected; cutting the auxiliary steel according to the size of the sample to be detected to form an auxiliary sample, wherein the thickness of the auxiliary sample is 1-2 mm, and the straightness of the auxiliary sample and the straightness of the sample to be detected are kept consistent; bonding the sample to be tested and the auxiliary sample by using double-sided copper conductive adhesive to form a combined sample, wherein the distance between the double-sided copper conductive adhesive and the edge to be ground of the sample to be tested is 2-3 mm; winding and fixing the combined sample, wherein after the combined sample is wound and fixed, the gap between the sample to be detected and the auxiliary sample is 0.05-0.15 mm; polishing the surface to be detected of the combined sample after winding and fixing by using a polishing machine, and removing the auxiliary sample after polishing is finished; carrying out ultrasonic cleaning and drying on the ground sample to be detected; and marking the defects of thesurface to be detected after cleaning the surface to be detected of the sample to be detected.

Description

technical field [0001] The invention belongs to the technical field of sample preparation, and in particular relates to a sample preparation process method. Background technique [0002] In the process of steel production, there are often some coils with surface defects, so it is necessary to analyze the cause of the problem in the process of scientific research. [0003] At present, a scanning electron microscope (SEM, Scanning Electron Microscope) is generally used to observe and analyze samples. Generally speaking, the cross-section analysis results of the sample are the most representative, and the cross-section samples of surface defects need to better ensure the perfect sample preparation at the edge defects of the cross-section, so that the defects cannot be ground away, and the defects should be presented to the maximum extent. The most original shape and composition. Only in this way can the precision and accuracy of the analysis results of the sample section be e...

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problems existing in the prior art, the embodiment of the present invention provides a sample preparation process method, which is used to solve the deformation, damage or contamination of the edge of the sample caused by the conventional sample preparation method in the prior art, which leads to the analysis of the sample The results are inaccurate, and cannot provide objective and accurate data for process improvement and product quality improvement in actual production, which eventually leads to technical problems that cannot ensure product quality

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