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Dynamic histogram drawing time-of-flight distance measurement method and measurement system

A technology for time-of-flight and distance measurement, applied in the computer field, can solve the problems of increasing power consumption, signal-to-noise ratio and cost, increasing on-chip storage capacity, difficulty in achieving high precision and low power consumption, and achieving the effect of avoiding large memory capacity

Active Publication Date: 2022-07-29
ORADAR TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the improvement of resolution, frame rate, and accuracy often needs to rely on the circuit scale of the receiving end and the improvement of modulation and demodulation methods, but increasing the circuit scale will increase power consumption, signal-to-noise ratio, and cost; in addition, it will also increase on-chip storage. It has brought serious challenges to mass production; the current mode of modulation and demodulation is also difficult to achieve high precision, low power consumption and other requirements

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  • Dynamic histogram drawing time-of-flight distance measurement method and measurement system
  • Dynamic histogram drawing time-of-flight distance measurement method and measurement system
  • Dynamic histogram drawing time-of-flight distance measurement method and measurement system

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Embodiment Construction

[0034] In order to make the technical problems, technical solutions and beneficial effects to be solved by the embodiments of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0035] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element. In addition, the connection can be used for either a fixing function or a circuit connecting function.

[0036] It is to be understood that the terms "length", "width", "upper", "lower", ...

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Abstract

The invention discloses a method for measuring time-of-flight distance by drawing a dynamic histogram, comprising the following steps: S1, receiving a superpixel TDC output signal, and drawing a first histogram with a first precision time unit; S2, using the first straight line Calculate the first time of flight from the square graph; S3. According to the first time of flight, locate the combined pixel and draw a second histogram with a second precision time unit; the combined pixel is composed of at least one pixel, and the superpixel includes at least one pixel. One of the combined pixels; S4, using the second histogram to calculate the second time of flight. The present invention realizes large-scale and high-precision time-of-flight measurement by dynamically adjusting the histogram in the time-of-flight distance measurement system.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a time-of-flight distance measurement method and a measurement system for drawing a dynamic histogram. Background technique [0002] The Time of Flight (TOF) method calculates the distance of an object by measuring the flight time of the beam in space. It is widely used in consumer electronics, unmanned aerial vehicles, AR / VR and other fields. [0003] Distance measurement systems based on the time-of-flight principle, such as time-of-flight depth cameras, lidar and other systems often include a light source transmitter and receiver. The light source emits a beam to the target space to provide illumination, and the receiver receives the beam reflected by the target. The distance to the object is calculated by calculating the time it takes for the light beam to be received from emission to reflection. [0004] At present, there are two main types of lidar based on the time-of...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S17/10G01S7/487G01S7/4865G01S7/484G01S7/48G01S7/51
CPCG01S17/10G01S7/4876G01S7/4865G01S7/4804G01S7/51G01S7/484
Inventor 何燃朱亮王瑞闫敏
Owner ORADAR TECH CO LTD