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Semiconductor devices having recess in encapsulation material and associated production methods

A technology of encapsulating materials and semiconductors, which is applied in the field of semiconductor technology and can solve problems such as signal loss and power loss

Pending Publication Date: 2020-01-07
INFINEON TECH AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The use of encapsulation materials can lead to undesired power losses in the operation of semiconductor devices
For example, coupling between the encapsulation material and electromagnetic waves emitted from the semiconductor device may occur, which may result in signal loss

Method used

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  • Semiconductor devices having recess in encapsulation material and associated production methods
  • Semiconductor devices having recess in encapsulation material and associated production methods
  • Semiconductor devices having recess in encapsulation material and associated production methods

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0126] Example 1 is a method comprising: providing at least one semiconductor component, wherein each semiconductor component of the at least one semiconductor component comprises: a semiconductor chip, wherein the semiconductor chip has a first major surface and a The second main surface, and the sacrificial material arranged on the opposite second main surface of the semiconductor chip; encapsulating at least one semiconductor component with encapsulation material; removing the sacrificial material, wherein each semiconductor chip in the at least one semiconductor chip forming over a recess in the encapsulation material; and disposing at least one cover over the at least one recess, wherein a closed cavity is formed above each of the at least one semiconductor chip by the at least one recess and the at least one cover.

example 2

[0127] Example 2 is the method according to example 1, wherein the cavity is arranged above the opposite main surface of the respective semiconductor chip, wherein in an orthogonal projection onto the opposite main surface, the base surface of the sacrificial material and the The base area projects at least partially beyond the base area of ​​the semiconductor chip.

example 3

[0128] Example 3 is the method according to examples 1 or 2, wherein providing the at least one semiconductor component includes arranging an etch stop layer between the at least one semiconductor chip and the sacrificial material, and wherein removing the sacrificial material includes etching the sacrificial material, wherein the etch stop layer is exposed .

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Abstract

Embodiments of the present disclosure relate to a semiconductor device having a recess in an encapsulation material and an associated production method. The method comprises the steps: providing a least one semiconductor component, wherein each of at least one semiconductor component comprises: a semiconductor chip, and the semiconductor chip comprises a first main surface and a second main surface opposite the first main surface, and a sacrificial layer arranged above the opposite second main surface of the semiconductor chip. The method further comprises the step of encapsulating at least one semiconductor component with an encapsulation material. The method further comprises the step of removing the sacrificial material, wherein above each of at least one semiconductor chip a cutout isformed in the encapsulation material. The method further comprises the step of arranging at least one lid above at least one cutout, wherein a closed cavity is formed by at least one cutout and at least one lid above each of at least one semiconductor chip.

Description

technical field [0001] The present disclosure relates generally to semiconductor technology. In particular, the present disclosure relates to semiconductor devices having recesses in encapsulation materials and methods of manufacturing such semiconductor devices. Background technique [0002] In many applications, semiconductor chips contained in semiconductor devices must be protected from external influences. For this purpose, for example, semiconductor chips are embedded in an encapsulation material. The use of encapsulation materials can lead to undesired power losses in the operation of the semiconductor device. For example, coupling between the encapsulation material and electromagnetic waves emitted from the semiconductor device may occur, which may result in signal loss. Semiconductor device manufacturers are seeking to provide improved semiconductor devices and methods of manufacturing such semiconductor devices. In particular, it may be desirable to provide sem...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/60H01L23/31H01L21/56H01L23/482H01L23/488
CPCH01L23/3128H01L23/315H01L21/568H01L24/02H01L24/13H01L24/11H01L2224/02379H01L2224/02381H01L2224/111H01L2224/13024H01L2224/13019H01L2224/18H01L21/6835H01L2221/68331H01L2221/68363H01L21/565
Inventor C·盖斯勒W·哈特纳C·韦希特尔M·沃杰诺维斯基
Owner INFINEON TECH AG
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