Rapid microwave imaging method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 杭州泛利科技有限公司
- Publication Date
- 2020-01-14
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of microwave imaging and provides a fast microwave imaging method. Background technique
[0002] Microwave imaging technology is based on the research of microwave propagation and scattering in various complex media, and reconstructs the complex permittivity image inside the measured medium by measuring the scattered field data outside the measured medium. The measured scattering field carries a large amount of information about the scatterer. Using the prior knowledge about the scattering target, some characteristics of the scatterer itself can be extracted after appropriate mathematical processing, such as the shape of the scatterer, the dielectric constant distribution etc. Because microwave imaging can realize non-destructive detection of targets, can simultaneously perform geometric imaging and physical imaging of targets, and has high resolution, microwave imaging technology has a wide range of applic...