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Convenient and fast detection device for semiconductor memory

A detection device and memory technology, applied in the field of memory, can solve the problems of low efficiency and long time consumption, and achieve the effects of reducing working time, reducing working intensity and improving working efficiency

Active Publication Date: 2020-02-04
深圳市源微创新实业有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, with the development of society, electronic information has become the most important foundation of science and technology in the new century. In the era of big data, the storage capacity of memory and the quality of memory itself are becoming more and more important. Semiconductor memory, as one of the most common memories, has a global reputation. The huge sales and market, the process of testing the memory after the production and molding of the semiconductor memory is usually that the staff inserts the memory into the detection port of the detection device, and performs batch detection of the memory, but this detection method takes a long time. Moreover, after the detection, the staff need to manually classify the memory, and the efficiency is not very high, so it is necessary to invent a convenient semiconductor memory detection device

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  • Convenient and fast detection device for semiconductor memory
  • Convenient and fast detection device for semiconductor memory
  • Convenient and fast detection device for semiconductor memory

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Embodiment Construction

[0019] All features disclosed in this specification, or steps in all methods or processes disclosed, can be combined in any way, except for mutually exclusive features and steps.

[0020] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0021] Combine below Figure 1-7 The present invention is described in detail, and for convenience of description, the orientations mentioned below are now stipulated as follows: figure 1 The up, down, left, right, front and back directions of the projection relationship itself are the same.

[0022] see Figure 1-7 , an embodiment provided by the present invention: a convenient semiconductor memory detection device, including a body 20, a detect...

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Abstract

The invention discloses a convenient and fast detection device for a semiconductor memory. The detection device comprises a machine body, wherein a detection cavity is formed in the machine body, a sorting cavity is formed in the bottom wall of the detection cavity, a gear cavity is formed in the bottom wall of the sorting cavity, symmetric cavities are symmetrically formed in the left and right sides of the bottom wall of the gear cavity, spring cavities are symmetrically formed in the left side wall and the right side wall of the detection cavity, and detectors drive transmission motors to work through transmission wires, so that motor shafts are driven to rotate, belt wheels and auxiliary shafts are driven to rotate, eccentric wheels are driven to rotate, sliding plates and T-shaped blocks are driven to move towards the side away from the detection cavity, and then the semiconductor memory clamped between the two detectors is released. The device greatly reduces the working time, improves the working efficiency and is worthy of popularization.

Description

technical field [0001] The invention relates to the field of memory, in particular to a convenient semiconductor memory detection device. Background technique [0002] At present, with the development of society, electronic information has become the most important foundation of science and technology in the new century. In the era of big data, the storage capacity of memory and the quality of memory itself are becoming more and more important. Semiconductor memory, as one of the most common memories, has a global reputation. The huge sales and market, the process of testing the memory after the production and molding of the semiconductor memory is usually that the staff inserts the memory into the detection port of the detection device, and performs batch detection of the memory, but this detection method takes a long time. Moreover, after the detection, the staff need to manually classify the memory, and the efficiency is not very high. Therefore, it is necessary to invent...

Claims

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Application Information

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IPC IPC(8): B07C5/34B07C5/36B07C5/38
CPCB07C5/34B07C5/362B07C5/38
Inventor 路晓强
Owner 深圳市源微创新实业有限公司