Automatic test method, system and device for hardware circuit

Abstract

The invention discloses an automatic test method, system and device for a hardware circuit. The automatic test method comprises the following steps of S1, acquiring all test signals, and constructinga test control table; S2, controlling an oscilloscope probe mounted on a mechanical arm to move to a test point according to the test control table, so that the oscilloscope probe is in contact with the test point of a circuit to be tested; S3, controlling an oscilloscope to test the test signals of the test point based on the test control table to obtain test data; S4, storing the test data, andjudging the test data to obtain a judgment result; S5, judging whether an untested test signal exists in the test control table or not based on the test point, if yes, repeatedly executing the S2 to S5 to test the untested test signal, and if not, executing the step S6; and S6, generating a total test result table according to the test data and the judgment result of each test signal, and ending the test.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to an automatic testing method, system and device for hardware circuits. Background technique [0002] At present, the test for the newly developed hardware circuit generally includes: signal integrity (Singal Integrity, SI), power integrity (Power Integrity, PI) and other test content, such as: [0003] The Chinese invention patent with the application number CN201610938931.5 discloses a method and device for power integrity testing. The method includes: pre-determining the load voltage, and presetting that the output terminal of the circuit under test is not loaded; In the first state where the output terminal is not loaded with a load, control the circuit under test to be powered on; in the first state, monitor in real time whether the first output voltage output by the output terminal of the circuit under test is greater than or equal to the above-mentioned load voltage; ...

AI Technical Summary

Problems solved by technology

[0005] 1. The test of the hardware circuit basically relies on the tester to hold the oscilloscope probe to touch the test point. Generally, there are many test signals for the newly developed hardware circuit, and the test point is small, and the operation is extremely inconvenient. It takes a lot of man-hours to complete the test longer;

[0006] 2. The testing of most hardware circuits requires at least two testers to cooperate to complete, that is, one person searches for test points and saves test data, and the other person needs to ensure that the oscilloscope probe is in contact with the test points, which results in relatively high labor costs for testing. high;

[0007] 3. The recorded test data needs to be manually processed, and the data processing volume is relatively large, which consumes manpower and material resources

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