Spectral calibration method, device, equipment and storage medium for echelle spectrometer
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
- Publication Date
- 2021-02-09
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Abstract
Description
technical field
[0001] The present application relates to the technical field of echelle spectrometer application, in particular to a spectral calibration method, device, equipment and computer-readable storage medium for an echelle spectrometer. Background technique
[0002] Echelle spectrometers are widely used due to their many advantages such as online measurement, non-contact, and high measurement accuracy. For example, echelle spectrometers are usually used to obtain the content of each element of the measured object by measuring the spectral response curve of the substance. Specifically, using the one-to-one correspondence between the spectrum and the detector target surface in the echelle spectrometer, the position and energy of the imaging spot of the detector are calculated, and the spectral response curve of the substance to be measured is obtained. Measure the content of each element in a substance.
[0003] When measuring the spectral response curve of substanc...