Spectral calibration method, device, equipment and storage medium for echelle spectrometer

Abstract

The application discloses a spectral calibration method, device, equipment and computer-readable storage medium for a ladder spectrometer. Among them, the method includes using an image processing algorithm to calculate the coordinate deviation value of the spot position of the mercury lamp at different wavelengths in the current frame; if the coordinate deviation value is not within the tolerance range of the deviation, an instruction that the rotation angle of the detector installation position does not meet the requirements is generated. Among them, the deviation allowable range is determined based on the coordinate deviation standard curve and the threshold value; the coordinate deviation standard curve is obtained by fitting the coordinate deviation value and the corresponding position deviation of the spot positions of different wavelengths; the position deviation is the theoretical position and detection of the characteristic spectrum design model The deviation of the actual position of the laser spot from the best matching position. This application solves the problem in the related art that the spectral calibration accuracy is reduced due to the rotation of the spot position relative to the optical system, ensures the installation and debugging accuracy of the ladder spectrometer detector, and effectively improves the spectral calibration accuracy of the ladder spectrometer.

Description

technical field [0001] The present application relates to the technical field of echelle spectrometer application, in particular to a spectral calibration method, device, equipment and computer-readable storage medium for an echelle spectrometer. Background technique [0002] Echelle spectrometers are widely used due to their many advantages such as online measurement, non-contact, and high measurement accuracy. For example, echelle spectrometers are usually used to obtain the content of each element of the measured object by measuring the spectral response curve of the substance. Specifically, using the one-to-one correspondence between the spectrum and the detector target surface in the echelle spectrometer, the position and energy of the imaging spot of the detector are calculated, and the spectral response curve of the substance to be measured is obtained. Measure the content of each element in a substance. [0003] When measuring the spectral response curve of substanc...

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Problems solved by technology

[0007] However, when the installation angle of the detector rotates, the position of the imaging spot also rotates, and the theoretical model does not have the ability to resist rotation when matching

Therefore, once the detector target surface is rotated during the installation process, or the spot position is rotated relative to the optical system, a large deviation will occur in the matching process between the characteristic spectrum design model and the actual position, which seriously reduces the spectral calibration accuracy of the echelle spectrometer

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