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Method for detecting generalized orientation degree of polyacrylonitrile fibers by applying two-dimensional X-ray diffraction

A technology of polyacrylonitrile fiber and degree of orientation, which is applied in the direction of material analysis using radiation diffraction, and can solve problems such as inaccuracy and incompleteness

Inactive Publication Date: 2020-03-17
JILIN UNIV
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Problems solved by technology

So far, the PAN fiber X-ray method used at home and abroad to measure the degree of orientation is based on the (100) diffraction line of the crystal phase, but there are obvious incompleteness and inaccuracy

Method used

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  • Method for detecting generalized orientation degree of polyacrylonitrile fibers by applying two-dimensional X-ray diffraction
  • Method for detecting generalized orientation degree of polyacrylonitrile fibers by applying two-dimensional X-ray diffraction
  • Method for detecting generalized orientation degree of polyacrylonitrile fibers by applying two-dimensional X-ray diffraction

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Embodiment Construction

[0015] The technical solution of the present invention will be further explained and described in the manner of specific embodiments below.

[0016] 1) The polyacrylonitrile fiber is tested by a two-dimensional X-ray diffractometer to obtain a two-dimensional diffraction pattern, and at the same time, the I(2θ,κ) curve can be obtained, that is, the diffraction intensity-diffraction angle-azimuth curve;

[0017] 2) For the crystal phase, select the (100) crystal plane diffraction angle 2θ c = 16.9°, at diffraction angle 2θ c Calculate the curve integral within the range of ±Δ2θ; for the oriented amorphous phase, select the diffraction angle 2θ o =25.2°, at diffraction angle 2θ o Calculate the curve integral within the range of ±Δ2θ; obtain the I~κ curve respectively, that is, the diffraction intensity-azimuth angle curve; Δ2θ is 1°~5°;

[0018] 3) Calculate the half-height width of the two I~κ curves respectively, and the half-height width of the crystalline phase curve is H...

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Abstract

The invention provides a method for detecting the generalized orientation degree of polyacrylonitrile fibers by applying two-dimensional X-ray diffraction and belongs to the technical field of material crystal structure analysis and detection. At home and abroad, methods for measuring the orientation degree by using a PAN fiber X-ray method are carried out aiming at diffraction rays of a crystalline phase (100), but have obvious incompleteness and inaccuracy. The method is characterized in that through taking a two-dimensional diffraction pattern as a basis, selecting characteristic diffraction angles, a diffraction intensity-azimuth angle curve is obtained through integration, the crystalline phase orientation degree Ac, the oriented amorphous phase orientation degree Ao and the amorphousphase orientation degree Aa are obtained through calculation according to the half-peak width of the curve, orientation states of the crystalline phase, the oriented amorphous phase and the amorphousphase in the PAN fiber are completely represented, and compared with the prior art, the result is more accurate.

Description

technical field [0001] The invention belongs to the technical field of material crystal structure analysis and detection. Background technique [0002] Polyacrylonitrile fiber is the precursor of high-quality carbon fiber, and its structural characteristics have an important impact on the quality of carbon fiber. PAN fibers belong to the conformation of macromolecular chains. The atoms in the molecular chains are connected by covalent strong bonds, while the inter-molecular chains are hydrogen bonds and van der Waals weak bonds. Therefore, the orientation state of the molecular chain has an important influence on the axial strength and modulus of the polyacrylonitrile (PAN) fiber precursor, so the orientation behavior of the crystalline phase, the oriented amorphous phase and the amorphous phase along the fiber axis is the key to the PAN fiber. key structural parameters. So far, the PAN fiber X-ray method used at home and abroad to measure the degree of orientation is base...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20
CPCG01N23/20
Inventor 高忠民唐海通高宇李向山
Owner JILIN UNIV
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