Real-time three-dimensional measurement method based on primary projection structured light parallel stripe pattern

A fringe pattern and structured light technology, applied in the field of optical three-dimensional sensing, can solve the problems of low measurement accuracy and poor ability to resist external light interference, and solve the problems of low accuracy, inability to measure moving or deformed objects, and obvious contrast Effect

Inactive Publication Date: 2020-03-27
SHANDONG UNIV OF TECH
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Problems solved by technology

[0003] The purpose of the present invention is to provide a three-dimensional measurement method based on one-time projection of structured light parallel stripes for the existing real-time structured light three-dimensional measurement technology with low measurement accuracy and poor ability to resist external light interference. The method i

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  • Real-time three-dimensional measurement method based on primary projection structured light parallel stripe pattern
  • Real-time three-dimensional measurement method based on primary projection structured light parallel stripe pattern
  • Real-time three-dimensional measurement method based on primary projection structured light parallel stripe pattern

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Embodiment Construction

[0011] The present invention will be described in detail below according to the accompanying drawings and working principle.

[0012] attached figure 1 It is a system structure diagram of the present invention. Including an industrial camera, an industrial projector and a high-performance computer. In order to ensure the resolution of the 3D reconstruction results, the resolutions of the industrial camera and the industrial projector are respectively selected as 1280×1024 and 1920×1080 or higher. The image capture frame rate of the camera and the projection frame rate of the projector are both greater than 10 frames per second. Because fringe pattern generation, image capture, image processing and 3D reconstruction are all done by computer, in order to meet real-time requirements, the computer is selected as i7-6700 CPU@ 3.4GHz 16G ram or higher performance configuration.

[0013] attached figure 2 It is the system calibration flowchart of the present invention. It mainl...

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Abstract

The invention discloses a real-time three-dimensional measurement method based on a primary projection structured light parallel stripe pattern. The method comprises the following steps of through a structured light projection device, t, projecting a single black and white or color structured light parallel stripe pattern to a surface of a measured object; recording deformed black and white or color structured light stripe patterns through a single camera device; extracting each deformed stripe through a stripe segmentation technology; classifying the extracted deformed stripes from bottom totop or from top to bottom through a stripe clustering technology; fitting the classified deformation fringes through a spline function; generating a longitudinal coordinate matrix according to the longitudinal coordinates of the fitting line in the image, improving the resolution of the coordinate matrix through a spline interpolation method to enable the resolution of the coordinate matrix to beconsistent with the resolution of the image of the camera device, generating a longitudinal coordinate graph, and calculating the three-dimensional shape of the measured object in real time through the longitudinal coordinate graph and the calibrated system parameters. According to the invention, real-time robust measurement can be carried out on a static, moving or deformed object in a darkroom or an outdoor scene.

Description

technical field [0001] The invention relates to optical three-dimensional sensing technology, in particular to real-time measurement of the three-dimensional shape of an object surface by projecting a single pattern composed of parallel black and white stripes or colored stripes. Background technique [0002] The invention relates to a real-time three-dimensional measurement method based on one-time projection structured light. The three-dimensional measurement technology based on one-shot structured light can measure not only the three-dimensional data of stationary objects, but also the three-dimensional data of moving or deformed objects, and is not limited by the state of motion of objects at all. At present, the technologies that can perform real-time measurement of moving or deformed objects mainly include binocular / multi-eye vision technology, time of flight (TOF) technology and one-time projection structured light measurement technology. Among them, the algorithm co...

Claims

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Application Information

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IPC IPC(8): G01B11/02G01B11/25G01B11/24
CPCG01B11/02G01B11/2433G01B11/2509G01B11/2513
Inventor 王振洲
Owner SHANDONG UNIV OF TECH
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