A single-point laser test platform

Abstract

The invention discloses a single-point laser test platform, which specifically relates to the technical field of experimental test equipment, including a base, and equipment racks are fixedly arranged on both sides of the top of the base, and are fixedly arranged between the two equipment racks. There is a fixed plate, the bottom of the fixed plate is fixedly provided with an operating platform, the middle part of the fixed plate is fixedly provided with a positioning platform; the middle part of the operating platform is movably provided with a movable support, and the top of the movable support is fixedly provided with a fixed platform, The four corners of the top of the fixed table are fixedly provided with fixed rods, and the tops of the four fixed rods are fixedly provided with pressing tables. In the present invention, by providing an extendable movable support, it is convenient for the chip to be fixed and clamped between the movable table and the pressing table, and the heat conduction vane absorbs it, and cooperates with the heat dissipation fan to drive the air flow to facilitate the heat dissipation during the test process. Avoid high heat affecting the accuracy of the test and avoid affecting the test results.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of experimental testing equipment, and in particular to a single-point laser testing platform. Background technique [0002] Laser error injection refers to injecting a precise laser beam with adjustable parameters such as energy and duration at a specific physical position and at a specific moment during the operation of the chip, so as to cause specific errors in the chip and use it to modify the program flow purposefully. , tamper with the read and write content of the memory and even obtain sensitive information such as keys. [0003] The existing technology has the following disadvantages: the chip needs to be clamped and placed fixedly in the experimental test, the clamping is unstable, and it is easy to affect the test operation, a large amount of heat is generated during the working process of the chip, and the high temperature is easy to affect the test result. Contents of th...

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Problems solved by technology

[0004] To this end, the embodiment of the present invention provides a single-point laser test platform. By setting an extendable movable support, it is convenient for the chip to be fixed and clamped between the movable platform and the compression platform, and the heat conduction blade is used for absorption, and the heat dissipation fan is used. Drive the airflow movement to realize the heat dissipation effect, facilitate the fixed installation of the sample chip, facilitate the heat dissipation of the heat generated during the test process, avoid the high heat generated by the chip from affecting the accuracy of the test, and avoid affecting the test results, so as to solve the problem in the prior art. It is inconvenient to install and fix the chip, and the high heat generated by the chip affects the problems caused by the test experiment

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