Hyperspectral rapid atmospheric correction parameterization method

A technology for atmospheric correction and atmospheric environment parameters, applied in the measurement of color/spectral characteristics, etc., can solve the problems of low work efficiency, large computer resources and time consumption, insufficient reflectivity inversion accuracy, etc., to achieve accurate calibration results and improve accuracy. and efficiency effects

Active Publication Date: 2020-04-10
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF4 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to solve the problem that in the field of quantitative remote sensing, when the widely used radiation transfer model method is used for atmospheric correction, the calculation process needs to consume a lot of computer resources and time, resulting in low work efficiency and insufficient accuracy of reflectivity inversion. Technical problem, providing a hyperspectral fast atmospheric correction parameterization method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Hyperspectral rapid atmospheric correction parameterization method
  • Hyperspectral rapid atmospheric correction parameterization method
  • Hyperspectral rapid atmospheric correction parameterization method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] The impact of ETM+ in the Shunyi area of ​​Beijing, the acquisition time of the impact was April 17, 2001, and the geographic coordinates are (40.25°, 243.5°).

[0037] (1) Obtain atmospheric environment parameters, solar zenith angle and pixel observation parameters;

[0038] (2) Establish atmospheric correction calculation model: Among them, ρ t is the surface reflectance, L 0 (μ v ) is the path radiation item, which can also be called the atmospheric radiation range, S is the albedo of the atmospheric hemisphere, F d is the total downlink radiation, T(μ v ) is the atmospheric transmittance; analysis of the above atmospheric correction calculation model shows that when the imaging spectrometer is at the same height as the measured object, the atmospheric transmittance T(μ v ) with a value of 1, the large-pass radiation L 0 (μ v ) is 0; at the same time, when the surface reflectance ρ t When it is 0, the apparent radiance L(μ v ) value is only related to the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to a hyperspectral atmospheric correction method in quantitative remote sensing. In order to solve technical problems that in the field of quantitative remote sensing, when a widely applied radiation transmission model method is adopted to carry out atmospheric correction, a large amount of computer resources and time are consumed in the calculation process, the work efficiency is low, and the reflectivity inversion precision is insufficient, the invention provides a hyperspectral rapid atmospheric correction parameterization method. The method includes acquiring environment and observation parameters; and establishing an atmospheric correction calculation model, setting a preset surface reflectance value and a final altitude H2 value, obtaining apparent radiance corresponding to different wave bands by using the MODTRAN model, calculating atmospheric correction parameters by using the atmospheric correction calculation model, establishing a lookup table, calculating the apparent radiance and looking up the table to complete atmospheric correction. And five times of analog calculation are performed, so that atmospheric path radiation is effectively avoided, and the precision and efficiency of radiation correction are further improved.

Description

technical field [0001] The invention belongs to a hyperspectral atmospheric correction method in quantitative remote sensing, and in particular relates to a hyperspectral rapid atmospheric correction parameterization method. Background technique [0002] In the field of quantitative remote sensing, due to atmospheric scattering and absorption, as well as terrain and other factors, the surface reflected radiation energy received by the sensor will change, which greatly affects the accuracy of spectral information extraction. In order to make the measured value obtained from the sensor have a high consistency with the real spectral reflectance of the surface object, it is usually necessary to perform atmospheric correction on the DN value generated by the acquisition (the digital quantization value output by each detection element of the imaging spectrometer) to obtain More accurate surface albedo values. Therefore, atmospheric correction has become an inevitable problem in q...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25
CPCG01N21/25
Inventor 李海巍陈军宇张耿胡炳樑
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products